Yoon Jong-Gul
Department of Physics and Electronic Materials Engineering, University of Suwon, Gyeonggi-do 18323, Korea.
Materials (Basel). 2020 Aug 20;13(17):3680. doi: 10.3390/ma13173680.
Energy-efficient computing paradigms beyond conventional von-Neumann architecture, such as neuromorphic computing, require novel devices that enable information storage at nanoscale in an analogue way and in-memory computing. Memristive devices with long-/short-term synaptic plasticity are expected to provide a more capable neuromorphic system compared to traditional Si-based complementary metal-oxide-semiconductor circuits. Here, compositionally graded oxide films of Al-doped MgZnO (-Al:MgZnO) are studied to fabricate a memristive device, in which the composition of the film changes continuously through the film thickness. Compositional grading in the films should give rise to asymmetry of Schottky barrier heights at the film-electrode interfaces. The -Al:MgZnO films are grown by using aerosol-assisted chemical vapor deposition. The current-voltage () and capacitance-voltage () characteristics of the films show self-rectifying memristive behaviors which are dependent on maximum applied voltage and repeated application of electrical pulses. Endurance and retention performance tests of the device show stable bipolar resistance switching (BRS) with a short-term memory effect. The short-term memory effects are ascribed to the thermally activated release of the trapped electrons near/at the -Al:MgZnO film-electrode interface of the device. The volatile resistive switching can be used as a potential selector device in a crossbar memory array and a short-term synapse in neuromorphic computing.
超越传统冯·诺依曼架构的节能计算范式,如神经形态计算,需要能够以模拟方式在纳米尺度实现信息存储和内存计算的新型器件。与传统的基于硅的互补金属氧化物半导体电路相比,具有长/短期突触可塑性的忆阻器件有望提供更强大的神经形态系统。在此,对掺铝的MgZnO(-Al:MgZnO)成分渐变氧化膜进行研究以制造忆阻器件,其中膜的成分沿膜厚度连续变化。膜中的成分渐变应会导致膜 - 电极界面处肖特基势垒高度的不对称性。-Al:MgZnO膜通过气溶胶辅助化学气相沉积法生长。膜的电流 - 电压()和电容 - 电压()特性显示出自整流忆阻行为,该行为取决于最大施加电压和电脉冲的重复施加。该器件的耐久性和保持性能测试表明其具有稳定的双极电阻开关(BRS)和短期记忆效应。短期记忆效应归因于器件的 -Al:MgZnO膜 - 电极界面附近/处捕获电子的热激活释放。这种易失性电阻开关可作为交叉阵列存储器中的潜在选择器器件以及神经形态计算中的短期突触。