采用大气压等离子体射流共聚技术合成噻吩与苯胺共聚物及其性能研究

Synthesis and Properties of Thiophene and Aniline Copolymer Using Atmospheric Pressure Plasma Jets Copolymerization Technique.

作者信息

Jang Hyo Jun, Park Choon-Sang, Jung Eun Young, Bae Gyu Tae, Shin Bhum Jae, Tae Heung-Sik

机构信息

School of Electronic and Electrical Engineering, College of IT Engineering, Kyungpook National University, Daegu 41566, Korea.

Department of Electrical and Computer Engineering, College of Engineering, Kansas State University, Manhattan, KS 66506, USA.

出版信息

Polymers (Basel). 2020 Sep 28;12(10):2225. doi: 10.3390/polym12102225.

This paper investigates the properties of thiophene and aniline copolymer (TAC) films deposited by using atmospheric pressure plasma jets copolymerization technique relative to various blending ratios of aniline and thiophene monomer for synthesizing the donor-acceptor conjugated copolymers. Field emission scanning electron microscopy (FE-SEM) and atomic force microscopy are utilized to measure the surface morphology, roughness and film thickness of TAC films. Structural and chemical properties of TAC films are investigated by Fourier transforms-infrared spectroscopy (FT-IR), time of flight secondary ion mass spectrometry, and X-ray photoelectron spectroscopy. FE-SEM images show that the film thickness and nanoparticles size of the TAC films increase with an addition thiophene monomer in the aniline monomer. FE-SEM, FT-IR results show that TAC films are successfully synthesized on glass substrates in all cases. The iodine doped TAC film on the Si substrate with interdigitated electrodes shows the lowest electrical resistance at blending condition of thiophene of 25%.

本文研究了采用大气压等离子体射流共聚技术沉积的噻吩与苯胺共聚物（TAC）薄膜的性能，该技术涉及用于合成供体-受体共轭共聚物的苯胺和噻吩单体的各种混合比例。利用场发射扫描电子显微镜（FE-SEM）和原子力显微镜来测量TAC薄膜的表面形貌、粗糙度和薄膜厚度。通过傅里叶变换红外光谱（FT-IR）、飞行时间二次离子质谱和X射线光电子能谱来研究TAC薄膜的结构和化学性质。FE-SEM图像显示，随着苯胺单体中噻吩单体的添加，TAC薄膜的厚度和纳米颗粒尺寸增加。FE-SEM、FT-IR结果表明，在所有情况下均成功地在玻璃基板上合成了TAC薄膜。在具有叉指电极的硅基板上的碘掺杂TAC薄膜在噻吩混合比例为25%的条件下显示出最低的电阻。