Liu Penghuan
College of Optical and Electronic Technology, China Jiliang University, 310018 Hangzhou, China.
Laboratoire des Sciences du Numérique de Nantes, École Centrale de Nantes, 44321 Nantes, France.
Biomed Opt Express. 2020 Aug 19;11(9):5147-5165. doi: 10.1364/BOE.399547. eCollection 2020 Sep 1.
Random illumination microscopy (RIM) using uncontrolled speckle patterns has shown the capacity to surpass the Abbe's diffraction barrier, providing the possibility to design inexpensive and versatile structured illumination microscopy (SIM) devices. In this paper, I first present a review of the state-of-the-art joint reconstruction methods in RIM, and then propose a unified joint reconstruction approach in which the performance of various regularization terms can be evaluated under the same model. The model hyperparameter is easily tuned and robust in comparison to the previous methods and ℓ regularizer is proven to be a reasonable prior in most practical situations. Moreover, the degradation entailed by out-of-focus light in conventional SIM can be easily solved in RIM setup.
使用无控散斑图案的随机照明显微镜（RIM）已显示出超越阿贝衍射极限的能力，为设计廉价且通用的结构照明显微镜（SIM）设备提供了可能性。在本文中，我首先综述了RIM中最新的联合重建方法，然后提出了一种统一的联合重建方法，在该方法中可以在同一模型下评估各种正则化项的性能。与先前方法相比，该模型超参数易于调整且稳健，并且在大多数实际情况下，ℓ正则化器被证明是一种合理的先验。此外，在RIM设置中可以轻松解决传统SIM中由离焦光引起的退化问题。
