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一种基于玻璃-硅复合晶圆的电容式微机电系统加速度计的新型制造方法。

A Novel Fabrication Method for a Capacitive MEMS Accelerometer Based on Glass-Silicon Composite Wafers.

作者信息

He Yurong, Si Chaowei, Han Guowei, Zhao Yongmei, Ning Jin, Yang Fuhua

机构信息

Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100049, China.

Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.

出版信息

Micromachines (Basel). 2021 Jan 21;12(2):102. doi: 10.3390/mi12020102.

Abstract

In this paper, we report a novel teeter-totter type accelerometer based on glass-silicon composite wafers. Unlike the ordinary micro-electro-mechanical systems (MEMS) accelerometers, the entire structure of the accelerometer, includes the mass, the springs, and the composite wafer. The composite wafer is expected to serve as the electrical feedthrough and the fixed capacitance plate at the same time, to simplify the fabrication process, and to save on chip area. It is manufactured by filling melted borosilicate glass into an etched silicon wafer and polishing the wafer flat. A sensitivity of 51.622 mV/g in the range of ±5 g (g = 9.8 m/s2), a zero-bias stability under 0.2 mg, and the noise floor with 11.28 µg/√Hz were obtained, which meet the needs of most acceleration detecting applications. The micromachining solution is beneficial for vertical interconnection and miniaturization of MEMS devices.

摘要

在本文中,我们报道了一种基于玻璃-硅复合晶圆的新型跷跷板型加速度计。与普通的微机电系统(MEMS)加速度计不同,该加速度计的整个结构,包括质量块、弹簧和复合晶圆。复合晶圆有望同时用作电馈通和固定电容极板,以简化制造工艺并节省芯片面积。它是通过将熔化的硼硅酸盐玻璃填充到蚀刻的硅晶圆中并将晶圆抛光平整来制造的。在±5 g(g = 9.8 m/s²)范围内获得了51.622 mV/g的灵敏度、低于0.2 mg的零偏稳定性以及11.28 µg/√Hz的本底噪声,满足了大多数加速度检测应用的需求。这种微加工解决方案有利于MEMS器件的垂直互连和小型化。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad35/7911678/00e7851a7ff7/micromachines-12-00102-g001.jpg

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