Tao Jia-Jia, Jiang Jinbao, Zhao Shi-Nuan, Zhang Yong, Li Xiao-Xi, Fang Xiaosheng, Wang Peng, Hu Weida, Lee Young Hee, Lu Hong-Liang, Zhang David-Wei
State Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University, Shanghai 200433, China.
Center for Integrated Nanostructure Physics (CINAP), Institute for Basic Science (IBS), Department of Energy Science, Department of Physics, Sungkyunkwan University, Suwon 16419, Republic of Korea.
ACS Nano. 2021 Feb 23;15(2):3241-3250. doi: 10.1021/acsnano.0c09912. Epub 2021 Feb 5.
The superior optical and electronic properties of the two-dimensional (2D) rhenium disulfide (ReS) makes it suitable for nanoelectronic and optoelectronic applications. However, the internal defects coupled with with the low mobility and light-absorbing capability of ReS impede its utilization in high-performance photodetectors. Fabrication of mixed-dimensional heterojunctions is an alternative method for designing high-performance hybrid photodetectors. This study proposes a mixed-dimensional van der Waals (vdW) heterojunction photodetector, containing high-performance one-dimensional (1D) -type tellurium (Te) and 2D -type ReS, developed by depositing Te nanowires on ReS nanoflake using the dry transfer method. It can improve the injection and separation efficiency of photoexcited electron-hole pairs due to the type II heterojunction formed at the ReS and Te interface. The proposed heterojunction device is sensitive to visible-light sensitivity (632 nm) with an ultrafast photoresponse (5 ms), high responsivity (180 A/W), and specific detectivity (10), which is superior to the pristine Te and ReS photodetectors. As compared to the ReS device, the responsivity and response speed is better by an order of magnitude. These results demonstrate the fabrication and application potential of Te/ReS mixed-dimensional heterojunction for high-performance optoelectronic devices and sensors.
二维二硫化铼(ReS)优异的光学和电子特性使其适用于纳米电子和光电子应用。然而,ReS内部的缺陷以及其低迁移率和光吸收能力阻碍了它在高性能光电探测器中的应用。制备混合维度异质结是设计高性能混合光电探测器的一种替代方法。本研究提出了一种混合维度范德华(vdW)异质结光电探测器,它包含高性能的一维(1D)碲(Te)和二维(2D)ReS,通过使用干法转移方法将碲纳米线沉积在ReS纳米片上制成。由于在ReS和Te界面形成了II型异质结,它可以提高光激发电子 - 空穴对的注入和分离效率。所提出的异质结器件对可见光(632 nm)敏感,具有超快光响应(5 ms)、高响应度(180 A/W)和比探测率(10),优于原始的碲和ReS光电探测器。与ReS器件相比,响应度和响应速度提高了一个数量级。这些结果证明了碲/ReS混合维度异质结在高性能光电器件和传感器方面的制备和应用潜力。