Chen Cheng, Leach Richard, Wang Jian, Liu Xiaojun, Jiang Xiangqian, Lu Wenlong
Opt Express. 2021 Mar 1;29(5):7179-7196. doi: 10.1364/OE.418924.
In chromatic confocal microscopy, the signal characteristics influence the accuracy of the signal processing, which in turn determines measurement performance. Thus, a full understanding of the spectral characteristics is critical to enhance the measurement performance. Existing spectral models only describe the signal intensity-wavelength characteristics, without taking the displacement-wavelength relation into consideration. These models require prior knowledge of the optical design, which reduces the effectiveness in the optical design process. In this paper, we develop a two-dimensional spectral signal model to describe the signal intensity-wavelength-displacement characteristics in chromatic confocal microscopy without prior knowledge of the optical design layout. With this model, the influence of the dimensional characteristics of the confocal setup and the displacement-wavelength characteristics and monochromatic aberrations of the hyperchromatic objective are investigated. Experimental results are presented to illustrate the effectiveness of our signal model. Using our model, further evaluation of the spectral signal can be used to enhance the measurement performance of chromatic confocal microscopy.
在彩色共聚焦显微镜中，信号特性会影响信号处理的准确性，而信号处理的准确性又决定了测量性能。因此，全面了解光谱特性对于提高测量性能至关重要。现有的光谱模型仅描述了信号强度与波长的特性，未考虑位移与波长的关系。这些模型需要光学设计的先验知识，这降低了光学设计过程中的有效性。在本文中，我们开发了一种二维光谱信号模型，用于在无需光学设计布局先验知识的情况下描述彩色共聚焦显微镜中的信号强度 - 波长 - 位移特性。利用该模型，研究了共聚焦装置的尺寸特性以及超色差物镜的位移 - 波长特性和单色像差的影响。给出了实验结果以说明我们信号模型的有效性。使用我们的模型，对光谱信号的进一步评估可用于提高彩色共聚焦显微镜的测量性能。
