Department of Biomedical Engineering, Michigan State University, East Lansing, MI 48824, United States of America.
Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48824, United States of America.
J Neural Eng. 2021 Apr 27;18(4). doi: 10.1088/1741-2552/abf2e6.
Intracortical brain interfaces are an ever evolving technology with growing potential for clinical and research applications. The chronic tissue response to these devices traditionally has been characterized by glial scarring, inflammation, oxidative stress, neuronal loss, and blood-brain barrier disruptions. The full complexity of the tissue response to implanted devices is still under investigation.In this study, we have utilized RNA-sequencing to identify the spatiotemporal gene expression patterns in interfacial (within 100m) and distal (500m from implant) brain tissue around implanted silicon microelectrode arrays. Naïve, unimplanted tissue served as a control.The data revealed significant overall differential expression (DE) in contrasts comparing interfacial tissue vs naïve (157 DE genes), interfacial vs distal (94 DE genes), and distal vs naïve tissues (21 DE genes). Our results captured previously characterized mechanisms of the foreign body response, such as astroglial encapsulation, as well as novel mechanisms which have not yet been characterized in the context of indwelling neurotechnologies. In particular, we have observed perturbations in multiple neuron-associated genes which potentially impact the intrinsic function and structure of neurons at the device interface. In addition to neuron-associated genes, the results presented in this study identified significant DE in genes which are associated with oligodendrocyte, microglia, and astrocyte involvement in the chronic tissue response.. The results of this study increase the fundamental understanding of the complexity of tissue response in the brain and provide an expanded toolkit for future investigation into the bio-integration of implanted electronics with tissues in the central nervous system.
脑皮层内脑接口技术是一种不断发展的技术,在临床和研究应用方面具有巨大的潜力。这些设备对慢性组织的反应传统上表现为神经胶质瘢痕形成、炎症、氧化应激、神经元丢失和血脑屏障破坏。植入设备引起的组织反应的复杂性仍在研究中。在这项研究中,我们利用 RNA 测序技术来识别植入硅微电极阵列周围界面(距离植入物 100m 内)和远端(距离植入物 500m 处)脑组织的时空基因表达模式。未植入的组织作为对照。数据显示,界面组织与未植入组织(157 个差异表达基因)、界面组织与远端组织(94 个差异表达基因)和远端组织与未植入组织(21 个差异表达基因)之间的整体差异表达(DE)非常显著。我们的结果捕捉到了异物反应的先前特征化机制,如星形胶质细胞包裹,以及尚未在留置神经技术背景下特征化的新机制。特别是,我们观察到多个神经元相关基因的干扰,这些基因可能会影响神经元在设备界面的固有功能和结构。除了神经元相关基因,本研究结果还确定了与少突胶质细胞、小胶质细胞和星形胶质细胞参与慢性组织反应相关的基因的显著差异表达。这项研究的结果增加了对大脑组织反应复杂性的基本认识,并为未来研究植入电子设备与中枢神经系统组织的生物整合提供了扩展的工具包。