Wendel Philipp, Dietz Dominik, Deuermeier Jonas, Klein Andreas
Institute of Materials Science, Technical University of Darmstadt, 64287 Darmstadt, Germany.
i3N/CENIMAT, Department of Materials Science, Faculty of Science and Technology, Campus de Caparica, Universidade NOVA de Lisboa and CEMOP/UNINOVA, 2829-516 Caparica, Portugal.
Materials (Basel). 2021 May 20;14(10):2678. doi: 10.3390/ma14102678.
The current-voltage characteristics of ZnO/RuO2 Schottky diodes prepared by magnetron sputtering are shown to exhibit a reversible hysteresis behavior, which corresponds to a variation of the Schottky barrier height between 0.9 and 1.3 eV upon voltage cycling. The changes in the barrier height are attributed to trapping and de-trapping of electrons in oxygen vacancies.
通过磁控溅射制备的ZnO/RuO2肖特基二极管的电流-电压特性表现出可逆的滞后行为,这对应于在电压循环时肖特基势垒高度在0.9至1.3 eV之间的变化。势垒高度的变化归因于氧空位中电子的俘获和去俘获。