Vakulov Zakhar, Khakhulin Daniil, Zamburg Evgeny, Mikhaylichenko Alexander, Smirnov Vladimir A, Tominov Roman, Klimin Viktor S, Ageev Oleg A
Federal Research Centre, Southern Scientific Centre of the Russian Academy of Sciences (SSC RAS), 41 Chekhov St., 344006 Rostov-on-Don, Russia.
Research Laboratory of Functional Nanomaterials Technology, Southern Federal University, 2 Shevchenko St., 347922 Taganrog, Russia.
Materials (Basel). 2021 Aug 26;14(17):4854. doi: 10.3390/ma14174854.
One of the significant limitations of the pulsed laser deposition method in the mass-production-technologies of micro- and nanoelectronic and molecular device electronic fabrication is the issue of ensuring deposition of films with uniform thickness on substrates with large diameter (more than 100 mm) since the area of the laser spot (1-5 mm) on the surface of the ablated target is incommensurably smaller than the substrate area. This paper reports the methodology that allows to calculate the distribution profile of the film thickness over the surface substrate with a large diameter, taking into account the construction and technological parameters of the pulsed laser deposition equipment. Experimental verification of the proposed methodology showed that the discrepancy with the experiment does not exceed 8%. The modeling of various technological parameters influence on the thickness uniformity has been carried out. Based on the modeling results, recommendations and parameters are proposed for manufacturing uniform thickness films. The results allow for increasing the film thickness uniformity with the thickness distribution < 5% accounts for ~ 31% of 300 mm diameter substrate.
在微电子、纳米电子和分子器件电子制造的大规模生产技术中,脉冲激光沉积法的一个显著局限性是,由于被烧蚀靶材表面的激光光斑面积(1 - 5毫米)远小于大尺寸(超过100毫米)衬底的面积,难以确保在大尺寸衬底上沉积厚度均匀的薄膜。本文报道了一种方法,该方法考虑脉冲激光沉积设备的结构和工艺参数,能够计算大尺寸衬底表面薄膜厚度的分布轮廓。对所提方法的实验验证表明,与实验结果的偏差不超过8%。对各种工艺参数对厚度均匀性的影响进行了建模。基于建模结果,提出了制备厚度均匀薄膜的建议和参数。结果表明,对于直径300毫米的衬底,厚度分布< 5%时,薄膜厚度均匀性提高,占比约为31%。