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接受放射治疗的心脏植入式电子设备患者的当前临床实践:一项文献综述。

Current clinical practice in patients with cardiac implantable electronic devices undergoing radiotherapy: a literature review.

作者信息

Azraai Meor, D'Souza Daniel, Lin Yuan-Hong, Nadurata Voltaire

机构信息

Department of Cardiology, Bendigo Health, 100 Barnard Street, Bendigo, Victoria 3550, Australia.

出版信息

Europace. 2022 Mar 2;24(3):362-374. doi: 10.1093/europace/euab241.

Abstract

Patients with cardiac implantable electronic devices (CIED) undergoing radiotherapy (RT) are more common due to the ageing of the population. With newer CIEDs' implementing the complementary metal-oxide semiconductor (CMOS) technology which allows the miniaturization of CIED, it is also more susceptible to RT. Effects of RT on CIED ranges from device interference, device operational/memory errors of permanent damage. These malfunctions can cause life-threatening clinical effects. Cumulative dose is not the only component of RT that causes CIED malfunction, as neutron use and dose rate effect also affects CIEDs. The management of this patient cohort in clinical practice is inconsistent due to the lack of a consistent guideline from manufacturers and physician specialty societies. Our review will focus on the current clinical practice and the recently updated guidelines of managing patients with CIED undergoing RT. We aim to simplify the evidence and provide a simple and easy to use guide based on the recent guidelines.

摘要

随着人口老龄化,接受放射治疗(RT)的心脏植入式电子设备(CIED)患者越来越常见。随着新型CIED采用互补金属氧化物半导体(CMOS)技术,使得CIED能够小型化,但它也更容易受到RT的影响。RT对CIED的影响范围从设备干扰、设备操作/内存错误到永久性损坏。这些故障可能导致危及生命的临床后果。累积剂量并非导致CIED故障的RT唯一因素,因为中子的使用和剂量率效应也会影响CIED。由于制造商和医师专业协会缺乏一致的指南,临床实践中对这一患者群体的管理并不一致。我们的综述将聚焦于当前临床实践以及最近更新的关于管理接受RT的CIED患者的指南。我们旨在简化证据,并根据最新指南提供一份简单易用的指南。

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