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根据 DEGRO/DGK 指南对植入式心脏电子设备患者进行放射治疗——是否高估了相关错误的风险?

Radiotherapy of patients with cardiac implantable electronic devices according to the DEGRO/DGK guideline-is the risk of relevant errors overestimated?

机构信息

Universitätsklinikum Regensburg, Franz-Josef-Strauß-Allee 11, 93053, Regensburg, Germany.

出版信息

Strahlenther Onkol. 2019 Dec;195(12):1086-1093. doi: 10.1007/s00066-019-01502-0. Epub 2019 Aug 9.

Abstract

PURPOSE

Ionizing radiation is able to cause severe damage to cardiac implantable electronic devices (CIED). In Germany, the DEGRO/DGK guideline recommends close monitoring of patients with CIEDs undergoing radiotherapy (RT). Nevertheless, especially in the era of intensity-modulated techniques and predominant use of 6 MV photons, errors of CIEDs are rare events. Therefore, we performed daily CIED controls and hypothesized that no relevant device interaction would occur in our cohort.

METHODS

From 2014 to 2018, we collected data of 51 patients (62 courses) with daily interrogation (n = 1046) of CIED. The dose to the skin above the CIED was measured by semiconductor or ion chamber dosimetry at least once per RT course. In many cases the dose was also calculated.

RESULTS

The prescribed dose to the planning target volume (PTV) ranged from 7.5 to 78.0 Gy (IQR 27.8-61.0 Gy). The median measured cumulative dose to the skin above the CIED was 0.17 Gy, whereas the median calculated dose was 1.03 Gy. No error occurred in the group with maximum beam energy >10 MeV. Three events without clinical relevance could be recognized in the group with an intensity-modulated technique at 6 MV. None of the three concerned devices were located directly within the PTV.

CONCLUSION

Errors of CIEDs during RT are rare events. The approach according to the DEGRO/DGK guideline is safe, but also consumes resources. In our cohort it was not compulsory to relocate any CIED. Clinically relevant events are uncommon, so it remains debatable which procedure is necessary. Daily controls could be avoided in some selected cases without compromising patient safety.

摘要

目的

电离辐射能够对心脏植入式电子设备(CIED)造成严重损害。在德国,DEGRO/DGK 指南建议对接受放射治疗(RT)的 CIED 患者进行密切监测。然而,特别是在调强技术时代和主要使用 6MV 光子的情况下,CIED 出现错误的情况非常罕见。因此,我们对 CIED 进行了日常监测,并假设我们的患者中不会发生任何相关的设备交互作用。

方法

从 2014 年到 2018 年,我们收集了 51 名患者(62 个疗程)的数据,这些患者每天都对 CIED 进行询问(n=1046)。在每个 RT 疗程中,至少使用半导体或离子室剂量计测量一次 CIED 上方皮肤的剂量。在许多情况下,还计算了剂量。

结果

计划靶区(PTV)的规定剂量范围为 7.5 至 78.0Gy(IQR 27.8-61.0Gy)。CIED 上方皮肤的累积测量剂量中位数为 0.17Gy,而计算剂量中位数为 1.03Gy。在最大束能量>10MeV 的组中没有发生错误。在 6MV 的调强技术组中,可以识别出三个无临床意义的事件。这三个设备中没有一个位于 PTV 内。

结论

RT 期间 CIED 出现错误的情况非常罕见。根据 DEGRO/DGK 指南的方法是安全的,但也会消耗资源。在我们的患者中,没有必要重新定位任何 CIED。临床上相关的事件并不常见,因此哪种程序是必要的仍存在争议。在某些选定的情况下,无需监测患者安全,就可以避免日常控制。

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