Wood S D, Mangum B W, Filliben J J, Tillett S B
Institute for Basic Standards, National Bureau of Standards, Washington, D.C. 20234.
J Res Natl Bur Stand (1977). 1978 May-Jun;83(3):247-263. doi: 10.6028/jres.083.015.
In order to better characterize thermistors, a group of 405 bead-in-glass and disc thermistors were aged in constant temperature baths. Samples of 135 thermistors were aged in each of three constant temperature baths held at 0, 30, and 60 °C. Each sample was composed of 65 bead-in-glass and 70 disc thermistors which represented a total of six manufacturers and six resistance values. The thermistors were maintained at temperature for 550 to 770 days and their resistances and the bath temperatures were periodically monitored. Analysis of the data revealed systematic differences between bead-in-glass and disc thermistors upon ageing and indicated a dependence of ageing behavior on bath temperature and resistance value. Drift rates within groups of thermistors from each manufacturer were fairly uniform. Large initial changes in the drift rate for the disc thermistors at 30 and 60 °C (and to a much lesser extent in the bead-in-glass thermistors) require that thermistors for use at an accuracy level of a few tens of millikelvins be aged prior to use.
为了更好地表征热敏电阻,一组405个玻璃珠型和盘型热敏电阻在恒温浴中进行老化处理。135个热敏电阻样品分别在保持在0、30和60°C的三个恒温浴中进行老化。每个样品由65个玻璃珠型热敏电阻和70个盘型热敏电阻组成,它们代表了总共六个制造商和六个电阻值。热敏电阻在温度下保持550至770天,并定期监测其电阻和浴温。数据分析揭示了老化时玻璃珠型和盘型热敏电阻之间的系统差异,并表明老化行为依赖于浴温和电阻值。每个制造商的热敏电阻组内的漂移率相当均匀。30和60°C时盘型热敏电阻(以及玻璃珠型热敏电阻的程度要小得多)的漂移率的大的初始变化要求在精度水平为几十毫开尔文的情况下使用的热敏电阻在使用前进行老化处理。