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通过雾状化学气相沉积法生长的κ-GaO的锡诱导相稳定化及增强的热稳定性

Sn-Induced Phase Stabilization and Enhanced Thermal Stability of κ-GaO Grown by Mist Chemical Vapor Deposition.

作者信息

Kang Ha Young, Kang Habin, Lee Eunhye, Lee Gyeong Ryul, Chung Roy Byung Kyu

机构信息

Electronic Materials Science and Engineering Department, Kyungpook National University, Daegu 41566 South Korea.

出版信息

ACS Omega. 2021 Nov 11;6(46):31292-31298. doi: 10.1021/acsomega.1c05130. eCollection 2021 Nov 23.

Abstract

Tin (Sn)-doped orthorhombic gallium oxide (κ-GaO) films were grown on (0001) sapphire by mist chemical vapor deposition. It is known that κ-GaO is more stable than α-GaO (corundum) but less stable than β-GaO (monoclinic). This thermodynamic stability means an optimal growth temperature ( ) of the κ-phase (600-650 °C) is also in between the two. At first, it was observed that Sn doping induced the κ-phase during the growth of the β-phase ( = 700 °C). Interestingly, Sn could also promote the κ-phase even under the growth condition that strongly favors the α-phase ( = 450 °C). The postgrowth annealing tests at 800-1000 °C showed that the thermal stability of the κ-phase depends on the Sn concentration. The higher the Sn concentration, the more stable the phase. The one with the highest Sn content showed no phase transition from κ to β after annealing at 800, 900, and 1000 °C for 30 min each. This enhancement of thermal stability promises more reliable high-power and high-frequency devices for which κ-GaO is suitable. Although there was no correlation between Sn-induced phase stabilization and the crystal quality, cathodoluminescence revealed that increasing Sn concentration led to the strong suppression of the radiative recombination at 340 nm from the vacancy-related donor-acceptor pairs. This observation suggests that the phase stabilization by Sn could be related to a specific Ga site Sn replaces in the orthorhombic structure.

摘要

通过雾状化学气相沉积法在(0001)蓝宝石上生长了掺锡正交氧化镓(κ-GaO)薄膜。已知κ-GaO比α-GaO(刚玉)更稳定,但比β-GaO(单斜晶)稳定性差。这种热力学稳定性意味着κ相的最佳生长温度( )(600 - 650°C)也介于两者之间。起初,观察到在β相生长过程中( = 700°C),锡掺杂诱导了κ相。有趣的是,即使在强烈有利于α相生长的条件下( = 450°C),锡也能促进κ相的生长。在800 - 1000°C下进行的生长后退火测试表明,κ相的热稳定性取决于锡的浓度。锡浓度越高,该相越稳定。锡含量最高的样品在800、900和1000°C下分别退火30分钟后均未出现从κ相向β相的相变。这种热稳定性的提高有望为适合κ-GaO的更可靠的高功率和高频器件提供保障。尽管锡诱导的相稳定与晶体质量之间没有相关性,但阴极发光显示,锡浓度的增加导致与空位相关的施主 - 受主对在340 nm处的辐射复合受到强烈抑制。这一观察结果表明,锡引起的相稳定可能与正交结构中锡取代的特定镓位点有关。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/16df/8613876/0ba27ca4efd4/ao1c05130_0002.jpg

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