Luan Chongbiao, Liu Hongwei, Ma Xun, Yuan Jianqiang, Wang Lingyun, Li Hongtao, Huang Yupeng, Kang Chuanhui
Key Laboratory of Pulsed Power, Institute of Fluid Physics, China Academy of Engineering Physics, P.O. Box 919-108, Mianyang 621900, China.
Rev Sci Instrum. 2022 Jan 1;93(1):014705. doi: 10.1063/5.0076291.
To study the damage and protection mechanism of the transient electromagnetic pulse to the cables of the electronic equipment under test, an all-solid-state pulsed current injection source with light initiated multi-gate semiconductor switches is developed. The output peak current range of the prepared all-solid-state pulsed current injection source was 0.1-1 kA, the risetime was 18 ns, and the pulse width was 520 ns. In addition, the waveforms of the output peak current were consistent.
为研究瞬态电磁脉冲对受试电子设备电缆的损伤及保护机制，研制了一种采用光触发多栅半导体开关的全固态脉冲电流注入源。所制备的全固态脉冲电流注入源输出峰值电流范围为0.1 - 1 kA，上升时间为18 ns，脉冲宽度为520 ns。此外，输出峰值电流的波形一致。
