Furieri T, Ancora D, Calisesi G, Morara S, Bassi A, Bonora S
National Council of Research of Italy, Institute of Photonics and Nanotechnology, via Trasea 7, 35131, Padova, Italy.
University of Padova, Department of Information Engineering, Via Gradenigo 6, 35131, Padova, Italy.
Biomed Opt Express. 2021 Dec 9;13(1):262-273. doi: 10.1364/BOE.441810. eCollection 2022 Jan 1.
The aberrations induced by the sample and/or by the sample holder limit the resolution of optical microscopes. Wavefront correction can be achieved using a deformable mirror with wavefront sensorless optimization algorithms but, despite the complexity of these systems, the level of correction is often limited to a small area in the field of view of the microscope. In this work, we present a plug and play module for aberration measurement and correction. The wavefront correction is performed through direct wavefront reconstruction using the spinning-pupil aberration measurement and controlling a deformable lens in closed loop. The lens corrects the aberrations in the center of the field of view, leaving residual aberrations at the margins, that are removed by anisoplanatic deconvolution. We present experimental results obtained in fluorescence microscopy, with a wide field and a light sheet fluorescence microscope. These results indicate that detection and correction over the full field of view can be achieved with a compact transmissive module placed in the detection path of the fluorescence microscope.
样品和/或样品架引起的像差限制了光学显微镜的分辨率。使用具有无波前传感器优化算法的可变形镜可以实现波前校正，但是，尽管这些系统很复杂，但校正水平通常仅限于显微镜视场中的小区域。在这项工作中，我们提出了一种用于像差测量和校正的即插即用模块。通过使用旋转光瞳像差测量进行直接波前重建并闭环控制可变形透镜来执行波前校正。该透镜校正视场中心的像差，边缘处留下残余像差，通过非等晕解卷积将其去除。我们展示了在宽场荧光显微镜和光片荧光显微镜中获得的实验结果。这些结果表明，通过放置在荧光显微镜检测路径中的紧凑型透射模块，可以在整个视场上实现检测和校正。
