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ITO/SnOx/ITO 的动态和静态切换及其突触应用。

Dynamic and Static Switching in ITO/SnOx/ITO and Its Synaptic Application.

机构信息

Division of Electronics and Electrical Engineering, Dongguk University, Seoul 04620, Korea.

出版信息

Int J Mol Sci. 2022 Sep 2;23(17):9995. doi: 10.3390/ijms23179995.

Abstract

The attempts to devise networks that resemble human minds are steadily progressing through the development and diversification of neural networks (NN), such as artificial NN (ANN), convolution NN (CNN), and recurrent NN (RNN). Meanwhile, memory devices applied on the networks are also being studied together, and RRAM is the one of the most promising candidates. The fabricated ITO/SnOX/TaN device showed two forms of current-voltage (I-V) curves, classified as dynamic and static. It was triggered from the forming process, and the difference between the two curves resulted from the data retention measured at room temperature for 10 s. The dynamic curve shows a time-dependent change in the data, and the cause of the data preservation period was considered through X-ray photoelectron spectroscopy (XPS) and linear fitting in conduction mechanisms. To confirm whether the memory performance of the device may be implemented on the synapse, the change in the plasticity was confirmed using a rectangular-shaped pulse. Paired-pulse facilitation (PPF) was implemented, and the change from short-term potentiation (STP) to long-term potentiation (LTP) was achieved.

摘要

通过开发和多样化的神经网络(NN),如人工神经网络(ANN)、卷积神经网络(CNN)和递归神经网络(RNN),尝试设计出类似人类大脑的网络正在稳步推进。与此同时,也在研究应用于网络上的存储设备,RRAM 是最有前途的候选者之一。制造的 ITO/SnOX/TaN 器件表现出两种形式的电流-电压(I-V)曲线,分为动态和静态。它是由形成过程触发的,两条曲线的差异来自于在室温下测量的 10 s 的数据保持。动态曲线显示数据随时间的变化,通过 X 射线光电子能谱(XPS)和传导机制的线性拟合来考虑数据保存期的原因。为了确认器件的存储性能是否可以在突触上实现,使用矩形脉冲确认了可塑性的变化。实现了成对脉冲易化(PPF),并从短期增强(STP)转变为长期增强(LTP)。

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