Ducry Fabian, Aeschlimann Jan, Luisier Mathieu
Integrated Systems Laboratory, ETH Zurich Gloriastrasse 35 CH-8092 Zurich Switzerland
Nanoscale Adv. 2020 May 19;2(7):2648-2667. doi: 10.1039/d0na00168f. eCollection 2020 Jul 14.
Following the emergence of novel classes of atomic systems with amorphous active regions, device simulations had to rapidly evolve to devise strategies to account for the influence of disordered phases, defects, and interfaces into its core physical models. We review here how molecular dynamics and quantum transport can be combined to shed light on the performance of, for example, conductive bridging random access memories (CBRAM), a type of non-volatile memory. In particular, we show that electro-thermal effects play a critical role in such devices and therefore present a method based on density functional theory and the non-equilibrium Green's function formalism to accurately describe them. Three CBRAM configurations are investigated to illustrate the functionality of the proposed modeling approach.
随着具有非晶态有源区的新型原子系统的出现,器件模拟必须迅速发展,以制定策略,将无序相、缺陷和界面的影响纳入其核心物理模型。我们在此回顾如何将分子动力学和量子输运结合起来,以阐明例如导电桥随机存取存储器(CBRAM)这类非易失性存储器的性能。特别是,我们表明电热效应在这类器件中起着关键作用,因此提出了一种基于密度泛函理论和非平衡格林函数形式的方法来准确描述它们。研究了三种CBRAM配置,以说明所提出的建模方法的功能。