Singh Maninderjeet, Dong Mei, Wu Wenjie, Nejat Roushanak, Tran David K, Pradhan Nihar, Raghavan Dharmaraj, Douglas Jack F, Wooley Karen L, Karim Alamgir
Department of Chemical and Biomolecular Engineering, University of Houston, Houston, Texas 77204, United States.
Departments of Chemistry, Chemical Engineering, and Materials Science & Engineering, Texas A&M University, College Station, Texas 77842, United States.
ACS Polym Au. 2022 Oct 12;2(5):324-332. doi: 10.1021/acspolymersau.2c00014. Epub 2022 Jun 23.
The maximum capacitive energy stored in polymeric dielectric capacitors, which are ubiquitous in high-power-density devices, is dictated by the dielectric breakdown strength of the dielectric polymer. The fundamental mechanisms of the dielectric breakdown, however, remain unclear. Based on a simple free-volume model of the polymer fluid state, we hypothesized that the free ends of linear polymer chains might act as "defect" sites, at which the dielectric breakdown can initiate. Thus, the dielectric breakdown strength of cyclic polymers should exhibit enhanced stability in comparison to that of their linear counterparts having the same composition and similar molar mass. This hypothesis is supported by the ∼50% enhancement in the dielectric breakdown strength and ∼80% enhancement in capacitive energy density of cyclic polystyrene melt films in comparison to corresponding linear polystyrene control films. Furthermore, we observed that cyclic polymers exhibit a denser packing density than the linear chain melts, an effect that is consistent with and could account for the observed property changes. Our work demonstrates that polymer topology can significantly influence the capacitive properties of polymer films, and correspondingly, we can expect polymer topology to influence the gas permeability, shear modulus, and other properties of thin films dependent on film density.
在高功率密度设备中普遍存在的聚合物介电电容器中存储的最大电容能量,由介电聚合物的介电击穿强度决定。然而,介电击穿的基本机制仍不清楚。基于聚合物流体状态的简单自由体积模型,我们假设线性聚合物链的自由端可能充当“缺陷”位点,介电击穿可以在此处引发。因此,与具有相同组成和相似摩尔质量的线性对应物相比,环状聚合物的介电击穿强度应表现出更高的稳定性。与相应的线性聚苯乙烯对照膜相比,环状聚苯乙烯熔体膜的介电击穿强度提高了约50%,电容能量密度提高了约80%,这一假设得到了支持。此外,我们观察到环状聚合物比线性链熔体表现出更高的堆积密度,这一效应与观察到的性能变化一致,并且可以解释这些变化。我们的工作表明,聚合物拓扑结构可以显著影响聚合物膜的电容性能,相应地,我们可以预期聚合物拓扑结构会影响气体渗透性、剪切模量以及其他取决于膜密度的薄膜性能。