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用于超分辨率显微镜的荧光碳点

Fluorescent Carbon Dots for Super-Resolution Microscopy.

作者信息

Sun Xiangcheng, Mosleh Nazanin

机构信息

Department of Chemical Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA.

出版信息

Materials (Basel). 2023 Jan 17;16(3):890. doi: 10.3390/ma16030890.

Abstract

Conventional fluorescence microscopy is limited by the optical diffraction of light, which results in a spatial resolution of about half of the light's wavelength, approximately to 250-300 nm. The spatial resolution restricts the utilization of microscopes for studying subcellular structures. In order to improve the resolution and to shatter the diffraction limit, two general approaches were developed: a spatially patterned excitation method and a single-molecule localization strategy. The success of super-resolution imaging relies on bright and easily accessible fluorescent probes with special properties. Carbon dots, due to their unique properties, have been used for super-resolution imaging. Considering the importance and fast development of this field, this work focuses on the recent progress and applications of fluorescent carbon dots as probes for super-resolution imaging. The properties of carbon dots for super-resolution microscopy (SRM) are analyzed and discussed. The conclusions and outlook on this topic are also presented.

摘要

传统荧光显微镜受光的光学衍射限制,这导致空间分辨率约为光波长的一半,即大约250 - 300纳米。这种空间分辨率限制了显微镜在研究亚细胞结构方面的应用。为了提高分辨率并突破衍射极限,人们开发了两种通用方法:空间图案化激发方法和单分子定位策略。超分辨率成像的成功依赖于具有特殊性质的明亮且易于获取的荧光探针。碳点因其独特性质已被用于超分辨率成像。鉴于该领域的重要性和快速发展,本文着重探讨荧光碳点作为超分辨率成像探针的最新进展及应用。分析并讨论了用于超分辨率显微镜(SRM)的碳点的性质。还给出了关于该主题的结论与展望。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3500/9917526/1f3419219469/materials-16-00890-g001.jpg

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