Institute for Photonics and Nanotechnology (IFN), Unit of Rome, National Research Council (CNR), Via del Fosso del Cavaliere 100, 00133 Rome, Italy.
Institute for Microelectronics and Microsystems (IMM), Unit of Rome, National Research Council (CNR), Via del Fosso del Cavaliere 100, 00133 Rome, Italy.
Sensors (Basel). 2023 Apr 22;23(9):4197. doi: 10.3390/s23094197.
Zinc oxide (ZnO) thin films have been grown by radio frequency sputtering technique on fused silica substrates. Optical and morphological characteristics of as-grown ZnO samples were measured by various techniques; an X-ray diffraction spectrum showed that the films exhibited hexagonal wurtzite structure and were c-axis-oriented normal to the substrate surface. Scanning electron microscopy images showed the dense columnar structure of the ZnO layers, and light absorption measurements allowed us to estimate the penetration depth of the optical radiation in the 200 to 480 nm wavelength range and the ZnO band-gap. ZnO layers were used as a basic material for surface acoustic wave (SAW) delay lines consisting of two Al interdigitated transducers (IDTs) photolithographically implemented on the surface of the piezoelectric layer. The Rayleigh wave propagation characteristics were tested in darkness and under incident UV light illumination from the top surface of the ZnO layer and from the fused silica/ZnO interface. The sensor response, i.e., the wave velocity shift due to the acoustoelectric interaction between the photogenerated charge carriers and the electric potential associated with the acoustic wave, was measured for different UV power densities. The reversibility and repeatability of the sensor responses were assessed. The time response of the UV sensor showed a rise time and a recovery time of about 10 and 13 s, respectively, and a sensitivity of about 318 and 341 ppm/(mW/cm) for top and bottom illumination, respectively. The ZnO/fused silica-based SAW UV sensors can be interrogated across the fused silica substrate thanks to its optical transparency in the UV range. The backlighting interrogation can find applications in harsh environments, as it prevents the sensing photoconductive layer from aggressive environmental effects or from any damage caused by cleaning the surface from dust which could deteriorate the sensor's performance. Moreover, since the SAW sensors, by their operating principle, are suitable for wireless reading via radio signals, the ZnO/fused-silica-based sensors have the potential to be the first choice for UV sensing in harsh environments.
氧化锌 (ZnO) 薄膜采用射频磁控溅射技术在熔融石英衬底上生长。采用各种技术测量了所生长 ZnO 样品的光学和形貌特性;X 射线衍射谱表明,薄膜具有六方纤锌矿结构,并且沿衬底表面垂直于 c 轴取向。扫描电子显微镜图像显示 ZnO 层的致密柱状结构,光吸收测量允许我们估计在 200 到 480nm 波长范围内光学辐射的穿透深度和 ZnO 带隙。ZnO 层用作包含两个 Al 叉指换能器 (IDT) 的声表面波 (SAW) 延迟线的基本材料,这些 IDT 通过在压电层的表面上进行光刻来实现。在黑暗中和从顶部表面和从熔融石英/ZnO 界面入射的紫外光照射下,测试了瑞利波的传播特性。测量了不同紫外光功率密度下的传感器响应,即由于光电载流子与与声波相关的电势之间的声电相互作用而引起的波速位移。评估了传感器响应的可逆性和可重复性。紫外传感器的时间响应表现出约 10 和 13s 的上升时间和恢复时间,以及分别为约 318 和 341ppm/(mW/cm)的顶部和底部照明的灵敏度。基于 ZnO/熔融石英的 SAW UV 传感器由于其在紫外范围内的光学透明性,可以在整个熔融石英衬底上进行询问。由于背光照相检测可以防止感测光电导层受到恶劣环境的影响,或者防止因从灰尘中清洁表面而导致的任何损坏,从而损坏传感器的性能,因此它可以在恶劣环境中找到应用。此外,由于 SAW 传感器根据其工作原理适用于通过无线电信号进行无线读取,因此基于 ZnO/熔融硅的传感器有可能成为恶劣环境中紫外感应的首选。