Xu Tao, Tang Ziqi, Zhou Ziyou, Zhou Bing
Key Laboratory of New Processing Technology for Nonferrous Metals and Materials of Ministry of Education, School of Materials Science and Engineering, Collaborative Innovation Center for Exploration of Nonferrous Metal Deposits and Efficient Utilization of Resources, Guilin University of Technology, Guilin 541004, China.
Ningbo Haitechuang Electric Control Co., Ltd., Ningbo 315000, China.
Micromachines (Basel). 2023 May 26;14(6):1121. doi: 10.3390/mi14061121.
This study investigated several AlGaN/GaN Schottky Barrier Diodes (SBDs) with different designs to achieve device optimization. First, the optimal electrode spacing, etching depth, and field plate size of the devices were measured using Technology Computer-Aided Design (TCAD) software by Silvaco, and analysis of the electrical behavior of the device was based on the simulation results, and several AlGaN/GaN SBD chips were designed and prepared. The experimental results revealed that the recessed anode can increase the forward current and reduce the on-resistance. An etched depth of 30 nm could obtain a turn-on voltage of 0.75 V and a forward current density of 216 mA/mm. A breakdown voltage of 1043 V and a power figure of merit (FOM) value of 572.6 MW/cm was obtained with a 3 μm field plate. Experiments and simulations confirmed that the recessed anode and field plate structure could increase the breakdown voltage and forward current and improve the FOM value, resulting in higher electrical performance and a wider range of application scenarios.
本研究对几种不同设计的氮化铝镓/氮化镓肖特基势垒二极管(SBD)进行了研究,以实现器件优化。首先,使用Silvaco公司的技术计算机辅助设计(TCAD)软件测量了器件的最佳电极间距、蚀刻深度和场板尺寸,并基于模拟结果对器件的电学行为进行了分析,设计并制备了几种氮化铝镓/氮化镓SBD芯片。实验结果表明,凹陷阳极可以增加正向电流并降低导通电阻。蚀刻深度为30 nm时,开启电压可达0.75 V,正向电流密度为216 mA/mm。使用3μm场板时,击穿电压为1043 V,功率优值(FOM)值为572.6 MW/cm。实验和模拟证实,凹陷阳极和场板结构可以提高击穿电压和正向电流,并提高FOM值,从而获得更高的电学性能和更广泛的应用场景。