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通过整合全基因组关联图谱和RNA测序分析来解析大豆(Glycine max L.)对疫霉根腐病抗性的遗传结构

Deciphering the genetic architecture of resistance to in soybean ( L.) by integrating genome-wide association mapping and RNA-Seq analysis.

作者信息

Patel Sejal, Patel Jinesh, Bowen Kira, Koebernick Jenny

机构信息

Department of Crop, Soil and Environmental Sciences, Auburn University, Auburn, AL, United States.

Department of Entomology and Plant Pathology, Auburn University, Auburn, AL, United States.

出版信息

Front Plant Sci. 2023 Sep 27;14:1255763. doi: 10.3389/fpls.2023.1255763. eCollection 2023.

Abstract

Target spot caused by is a problematic disease in tropical and subtropical soybean () growing regions. Although resistant soybean genotypes have been identified, the genetic mechanisms underlying target spot resistance has not yet been studied. To address this knowledge gap, this is the first genome-wide association study (GWAS) conducted using the SoySNP50K array on a panel of 246 soybean accessions, aiming to unravel the genetic architecture of resistance. The results revealed significant associations of 14 and 33 loci with resistance to LIM01 and SSTA isolates, respectively, with six loci demonstrating consistent associations across both isolates. To identify potential candidate genes within GWAS-identified loci, dynamic transcriptome profiling was conducted through RNA-Seq analysis. The analysis involved comparing gene expression patterns between resistant and susceptible genotypes, utilizing leaf tissue collected at different time points after inoculation. Integrating results of GWAS and RNA-Seq analyses identified 238 differentially expressed genes within a 200 kb region encompassing significant quantitative trait loci (QTLs) for disease severity ratings. These genes were involved in defense response to pathogen, innate immune response, chitinase activity, histone H3-K9 methylation, salicylic acid mediated signaling pathway, kinase activity, and biosynthesis of flavonoid, jasmonic acid, phenylpropanoid, and wax. In addition, when combining results from this study with previous GWAS research, 11 colocalized regions associated with disease resistance were identified for biotic and abiotic stress. This finding provides valuable insight into the genetic resources that can be harnessed for future breeding programs aiming to enhance soybean resistance against target spot and other diseases simultaneously.

摘要

由[病原体名称未给出]引起的靶斑病是热带和亚热带大豆种植区的一种疑难病害。尽管已鉴定出抗性大豆基因型,但尚未对抗性的遗传机制进行研究。为填补这一知识空白,这是首次使用SoySNP50K芯片对246份大豆种质进行全基因组关联研究(GWAS),旨在揭示抗性的遗传结构。结果显示,分别有14个和33个位点与对LIM01和SSTA分离株的抗性显著相关,其中6个位点在两个分离株中均表现出一致的关联。为了在GWAS鉴定的位点内识别潜在的候选基因,通过RNA测序分析进行了动态转录组分析。该分析包括比较抗性和感病基因型之间的基因表达模式,利用接种后不同时间点采集的叶片组织。整合GWAS和RNA测序分析的结果,在一个200 kb区域内鉴定出238个差异表达基因,该区域包含疾病严重程度评级的显著数量性状位点(QTL)。这些基因参与了对病原体的防御反应、先天免疫反应、几丁质酶活性、组蛋白H3-K9甲基化、水杨酸介导的信号通路、激酶活性以及类黄酮、茉莉酸、苯丙烷类和蜡质的生物合成。此外,将本研究结果与先前的GWAS研究结果相结合,确定了11个与生物和非生物胁迫抗性相关的共定位区域。这一发现为未来旨在同时提高大豆对靶斑病和其他病害抗性的育种计划可利用的遗传资源提供了有价值的见解。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad02/10565807/58a96d87d561/fpls-14-1255763-g001.jpg

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