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用于先进陶瓷电容器的具有优异温度和湿度稳定性的掺锡铌钛氧化物陶瓷的开创性介电材料。

Pioneering dielectric materials of Sn-doped NbTiO ceramics with excellent temperature and humidity stability for advanced ceramic capacitors.

作者信息

Mingmuang Yasumin, Chanlek Narong, Takesada Masaki, Swatsitang Ekaphan, Thongbai Prasit

机构信息

Giant Dielectric and Computational Design Research Group (GD-CDR), Department of Physics, Faculty of Science, Khon Kaen University Khon Kaen 40002 Thailand

Synchrotron Light Research Institute (Public Organization) 111 University Avenue, Muang District Nakhon Ratchasima 30000 Thailand.

出版信息

RSC Adv. 2024 Mar 4;14(11):7631-7639. doi: 10.1039/d3ra08336e. eCollection 2024 Feb 29.

Abstract

In this study, the rutile TiO system, widely acclaimed for its superior properties, was enhanced through co-doping with isovalent Sn ions and 2.5% Nb donor ions, diverging from traditional acceptor doping practices. This novel doping strategy was implemented by employing a conventional solid-state reaction method, resulting in the synthesis of Sn-doped NbTiO (Sn-NTO) ceramics. These ceramics demonstrated remarkable dielectric characteristics, with a high dielectric constant (') ranging from ∼27 000 to 34 000 and an exceptionally low loss tangent between 0.005 and 0.056 at ∼25 °C and 1 kHz. Notably, the temperature coefficient of ', , aligned with the stringent specifications for X7/8/9R capacitors. Furthermore, the Sn-NTO ceramics exhibited a stable response across various frequencies within a humidity range of 50 to 95% RH, with Δ (%) values within ±0.3%, and no hysteresis loop was detected, suggesting the absence of water molecule adsorption and desorption during humidity assessments. This behavior is primarily attributed to the effective suppression of oxygen vacancy formation by the Sn ions, which also affects the grain growth diffusion process in the Sn-NTO ceramics. The observed heterogeneous electrical responses between semiconducting grains and insulating grain boundaries in these polycrystalline ceramics are attributed to the internal barrier layer capacitor effect.

摘要

在本研究中,以其优异性能而广受赞誉的金红石TiO体系,通过与等价的Sn离子和2.5%的Nb施主离子共掺杂得到增强,这与传统的受主掺杂方法不同。这种新颖的掺杂策略是通过采用传统的固态反应方法实现的,从而合成了Sn掺杂的NbTiO(Sn-NTO)陶瓷。这些陶瓷表现出显著的介电特性,在约25°C和1 kHz时,介电常数(')高达约27000至34000,损耗角正切极低,在0.005至0.056之间。值得注意的是,'的温度系数,,符合X7/8/9R电容器的严格规格。此外,Sn-NTO陶瓷在50至95%RH的湿度范围内,在各种频率下都表现出稳定的响应,Δ(%)值在±0.3%以内,并且未检测到滞后回线,这表明在湿度评估期间不存在水分子的吸附和解吸。这种行为主要归因于Sn离子对氧空位形成的有效抑制,这也影响了Sn-NTO陶瓷中的晶粒生长扩散过程。在这些多晶陶瓷中观察到的半导体晶粒和绝缘晶界之间的非均匀电响应归因于内部势垒层电容效应。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c3bc/10910855/abc913a06cf2/d3ra08336e-f1.jpg

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