Swift Current Research and Development Center, Agriculture and Agri-Food Canada, Swift Current, SK, S9H 3X2, Canada.
Agriculture and Agri-Food Canada (Retired), Ottawa, Canada.
BMC Plant Biol. 2024 Mar 12;24(1):183. doi: 10.1186/s12870-023-04708-8.
Fusarium head blight (FHB) infection results in Fusarium damaged kernels (FDK) and deoxynivalenol (DON) contamination that are downgrading factors at the Canadian elevators. Durum wheat (Triticum turgidum L. var. durum Desf.) is particularly susceptible to FHB and most of the adapted Canadian durum wheat cultivars are susceptible to moderately susceptible to this disease. However, the durum line DT696 is less susceptible to FHB than commercially grown cultivars. Little is known about genetic variation for durum wheat ability to resist FDK infection and DON accumulation. This study was undertaken to map genetic loci conferring resistance to DON and FDK resistance using a SNP high-density genetic map of a DT707/DT696 DH population and to identify SNP markers useful in marker-assisted breeding. One hundred twenty lines were grown in corn spawn inoculated nurseries near Morden, MB in 2015, 2016 and 2017 and the harvested seeds were evaluated for DON. The genetic map of the population was used in quantitative trait locus analysis performed with MapQTL.6® software.
Four DON accumulation resistance QTL detected in two of the three years were identified on chromosomes 1 A, 5 A (2 loci) and 7 A and two FDK resistance QTL were identified on chromosomes 5 and 7 A in single environments. Although not declared significant due to marginal LOD values, the QTL for FDK on the 5 and 7 A were showing in other years suggesting their effects were real. DT696 contributed the favourable alleles for low DON and FDK on all the chromosomes. Although no resistance loci contributed by DT707, transgressive segregant lines were identified resulting in greater resistance than DT696. Breeder-friendly KASP markers were developed for two of the DON and FDK QTL detected on chromosomes 5 and 7 A. Markers flanking each QTL were physically mapped against the durum wheat reference sequence and candidate genes which might be involved in FDK and DON resistance were identified within the QTL intervals.
The DH lines harboring the desired resistance QTL will serve as useful resources in breeding for FDK and DON resistance in durum wheat. Furthermore, breeder-friendly KASP markers developed during this study will be useful for the selection of durum wheat varieties with low FDK and DON levels in durum wheat breeding programs.
镰刀菌穗腐病(FHB)感染导致镰刀菌损伤的籽粒(FDK)和脱氧雪腐镰刀菌烯醇(DON)污染,这是加拿大筒仓降级的因素。硬质小麦(Triticum turgidum L. var. durum Desf.)特别容易感染 FHB,大多数适应的加拿大硬质小麦品种对这种疾病的易感性为中等至高度敏感。然而,硬质小麦品系 DT696 比商业种植的品种对 FHB 的易感性较低。关于硬质小麦抵抗 FDK 感染和 DON 积累的能力的遗传变异知之甚少。本研究旨在利用 DT707/DT696 DH 群体的 SNP 高密度遗传图谱,对赋予 DON 和 FDK 抗性的遗传位点进行作图,并鉴定在标记辅助育种中有用的 SNP 标记。在 2015 年、2016 年和 2017 年,在曼尼托巴省莫登附近的玉米孢子接种苗圃中种植了 120 个品系,并对收获的种子进行了 DON 评估。该群体的遗传图谱用于 MapQTL.6®软件进行的数量性状位点分析。
在三年中的两年中检测到四个 DON 积累抗性 QTL,位于 1A、5A(2 个位点)和 7A 染色体上,两个 FDK 抗性 QTL 位于 5 和 7A 染色体上在单个环境中。尽管由于边际 LOD 值,位于 5 和 7A 染色体上的 FDK 抗性 QTL 没有被宣布为显著,但它们在其他年份的表现表明它们的作用是真实的。DT696 在所有染色体上都提供了低 DON 和 FDK 的有利等位基因。尽管 DT707 没有提供抗性基因座,但鉴定出了具有较高抗性的超亲分离群体。为在 5 和 7A 染色体上检测到的两个 DON 和 FDK QTL 开发了适合育种者的 KASP 标记。每个 QTL 侧翼的标记都根据硬质小麦参考序列进行了物理图谱绘制,并在 QTL 区间内鉴定出可能参与 FDK 和 DON 抗性的候选基因。
携带所需抗性 QTL 的 DH 系将作为硬质小麦中 FDK 和 DON 抗性育种的有用资源。此外,本研究中开发的适合育种者的 KASP 标记将有助于在硬质小麦育种计划中选择 DON 和 FDK 水平较低的硬质小麦品种。