Kolibaba Thomas J, Killgore Jason P, Caplins Benjamin W, Higgins Callie I, Arp Uwe, Miller C Cameron, Poster Dianne L, Zong Yuqin, Broce Scott, Wang Tong, Talačka Vaidas, Andersson Jonathan, Davenport Amelia, Panzer Matthew A, Tumbleston John R, Gonzalez Jasmine M, Huffstetler Jesse, Lund Benjamin R, Billerbeck Kai, Clay Anthony M, Fratarcangeli Marcus R, Qi H Jerry, Porcincula Dominique H, Bezek Lindsey B, Kikuta Kenji, Pearlson Matthew N, Walker David A, Long Corey J, Hasa Erion, Aguirre-Soto Alan, Celis-Guzman Angel, Backman Daniel E, Sridhar Raghuveer Lalitha, Cavicchi Kevin A, Viereckl R J, Tong Elliott, Hansen Christopher J, Shah Darshil M, Kinane Cecelia, Pena-Francesch Abdon, Antonini Carlo, Chaudhary Rajat, Muraca Gabriele, Bensouda Yousra, Zhang Yue, Zhao Xiayun
Applied Chemicals and Materials Division, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.
Sensor Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, USA.
Addit Manuf. 2024 Mar;84. doi: 10.1016/j.addma.2024.104082.
The working curve informs resin properties and print parameters for stereolithography, digital light processing, and other photopolymer additive manufacturing (PAM) technologies. First demonstrated in 1992, the working curve measurement of cure depth vs radiant exposure of light is now a foundational measurement in the field of PAM. Despite its widespread use in industry and academia, there is no formal method or procedure for performing the working curve measurement, raising questions about the utility of reported working curve parameters. Here, an interlaboratory study (ILS) is described in which 24 individual laboratories performed a working curve measurement on an aliquot from a single batch of PAM resin. The ILS reveals that there is enormous scatter in the working curve data and the key fit parameters derived from it. The measured depth of light penetration varied by as much as 7x between participants, while the critical radiant exposure for gelation varied by as much as 70x. This significant scatter is attributed to a lack of common procedure, variation in light engines, epistemic uncertainties from the Jacobs equation, and the use of measurement tools with insufficient precision. The ILS findings highlight an urgent need for procedural standardization and better hardware characterization in this rapidly growing field.
工作曲线为立体光刻、数字光处理及其他光聚合增材制造（PAM）技术提供树脂特性和打印参数。工作曲线测量，即固化深度与光辐射曝光量的关系，于1992年首次得到证明，如今已成为PAM领域的一项基础测量。尽管其在工业和学术界广泛应用，但目前尚无进行工作曲线测量的正式方法或程序，这引发了人们对所报告工作曲线参数实用性的质疑。在此，描述了一项实验室间研究（ILS），其中24个独立实验室对一批PAM树脂的一份样品进行了工作曲线测量。ILS结果表明，工作曲线数据及其导出的关键拟合参数存在极大的离散性。参与者之间测得的光穿透深度变化高达7倍，而凝胶化的临界辐射曝光量变化高达70倍。这种显著的离散性归因于缺乏通用程序、光引擎的差异、雅各布斯方程带来的认知不确定性以及使用了精度不足的测量工具。ILS的研究结果凸显了在这个快速发展的领域中，迫切需要程序标准化和更好的硬件特性描述。
