Wu Guangze, Wan Yuanjian, Wang Zhao, Hu Xiaolong, Zeng Jinwei, Zhang Yu, Wang Jian
Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, China.
Optics Valley Laboratory, Wuhan, 430074, China.
Front Optoelectron. 2024 Aug 5;17(1):26. doi: 10.1007/s12200-024-00127-1.
On-chip optical power monitors are indispensable for functional implementation and stabilization of large-scale and complex photonic integrated circuits (PICs). Traditional on-chip optical monitoring is implemented by tapping a small portion of optical power from the waveguide, which leads to significant loss. Due to its advantages like non-invasive nature, miniaturization, and complementary metal-oxide-semiconductor (CMOS) process compatibility, a transparent monitor named the contactless integrated photonic probe (CLIPP), has been attracting great attention in recent years. The CLIPP indirectly monitors the optical power in the waveguide by detecting the conductance variation of the local optical waveguide caused by the surface state absorption (SSA) effect. In this review, we first introduce the fundamentals of the CLIPP including the concept, the equivalent electric model and the impedance read-out method, and then summarize some characteristics of the CLIPP. Finally, the functional applications of the CLIPP on the identification and feedback control of optical signal are discussed, followed by a brief outlook on the prospects of the CLIPP.
片上光功率监测器对于大规模复杂光子集成电路（PIC）的功能实现和稳定运行不可或缺。传统的片上光学监测是通过从波导中提取一小部分光功率来实现的，这会导致显著的损耗。由于具有非侵入性、小型化以及与互补金属氧化物半导体（CMOS）工艺兼容等优点，一种名为非接触集成光子探头（CLIPP）的透明监测器近年来备受关注。CLIPP通过检测由表面态吸收（SSA）效应引起的局部光波导的电导变化来间接监测波导中的光功率。在这篇综述中，我们首先介绍CLIPP的基本原理，包括概念、等效电模型和阻抗读出方法，然后总结CLIPP的一些特性。最后，讨论了CLIPP在光信号识别和反馈控制方面的功能应用，随后对CLIPP的前景进行了简要展望。
