Birkedal Henrik, Sztucki Michael, Stammer Moritz, Sadetskaia Anastasiia, Burghammer Manfred C, Grünewald Tilman A
Department of Chemistry and iNANO Aarhus University 14 Gustav Wieds Vej 8000Aarhus Denmark.
European Synchrotron Radiation Facility (ESRF) Avenue des Martyrs 71 Grenoble38000 France.
J Appl Crystallogr. 2024 Oct 29;57(Pt 6):2043-2047. doi: 10.1107/S1600576724009129. eCollection 2024 Dec 1.
Quantitative X-ray diffraction approaches require careful correction for sample transmission. Though this is a routine task at state-of-the-art small-angle X-ray scattering (SAXS), wide-angle X-ray scattering (WAXS) or diffraction beamlines at synchrotron facilities, the transmission signal cannot be recorded concurrently with SAXS/WAXS when using the small, sub-millimetre beamstops at many X-ray nanoprobes during SAXS/WAXS experiments due to the divergence-limited size of the beamstop and the generally tight geometry. This is detrimental to the data quality and often the only solution is to re-scan the sample with a PIN photodiode as a detector to obtain transmission values. In this manuscript, we present a simple yet effective solution to this problem in the form of a small beamstop with an inlaid metal target for optimal fluorescence yield. This fluorescence can be detected with a high-sensitivity avalanche photodiode and provides a linear counter to determine the sample transmission.
定量X射线衍射方法需要对样品透射率进行仔细校正。虽然这在同步加速器设施中最先进的小角X射线散射(SAXS)、广角X射线散射(WAXS)或衍射光束线上是一项常规任务,但在SAXS/WAXS实验中,当在许多X射线纳米探针处使用小型亚毫米级光束阻挡器时,由于光束阻挡器的发散限制尺寸和通常紧凑的几何结构,透射信号无法与SAXS/WAXS同时记录。这对数据质量有害,通常唯一的解决办法是使用PIN光电二极管作为探测器重新扫描样品以获得透射率值。在本手稿中,我们以带有镶嵌金属靶以实现最佳荧光产率的小型光束阻挡器的形式,提出了一个简单而有效的解决该问题的方案。这种荧光可以用高灵敏度雪崩光电二极管检测到,并提供一个线性计数器来确定样品透射率。