Pugachev Alexey, Tumarkin Andrey, Adichtchev Sergey, Ivleva Ludmila, Bogdan Alexey
Institute of Authomation and Electrometry, Russian Academy of Sciences, 630090 Novosibirsk, Russia.
Department of Physical Electronics and Technology, St. Petersburg State Electrotechnical University "LETI", 197376 St. Petersburg, Russia.
Nanomaterials (Basel). 2024 Dec 6;14(23):1963. doi: 10.3390/nano14231963.
Strontium-barium niobate (SrBaNbO) films can be considered as a promising material for microwave applications due to high dielectric nonlinearity and relatively low losses. Since strontium-barium niobate has a disordered structure that determines its unique electrical properties, the identification of structural features of the SrBaNbO films is the key to their successful use. The SrBaNbO films were synthesized on a sapphire substrate by magnetron sputtering. The structure of the films was studied by both traditional methods of electron microscopy, X-ray diffraction, and the rarely used for thin films investigation Brillouin light scattering method, which was the focus of our study. We show that Brillouin light scattering is an excellent nondestructive method for studying the structural features of thin ferroelectric strontium-barium niobate films. An analysis of the features of the Brillouin light scattering spectra in thin-film structures and their comparison with the spectra of bulk crystals allowed us to determine with high accuracy the thickness of the films under study and their structural features determined by the resonant scattering of acoustic waves.
铌酸锶钡（SrBaNbO）薄膜由于具有高介电非线性和相对较低的损耗，可被视为一种有前景的微波应用材料。由于铌酸锶钡具有决定其独特电学性质的无序结构，因此识别SrBaNbO薄膜的结构特征是其成功应用的关键。通过磁控溅射在蓝宝石衬底上合成了SrBaNbO薄膜。采用传统的电子显微镜、X射线衍射方法以及很少用于薄膜研究的布里渊光散射方法对薄膜结构进行了研究，而布里渊光散射方法是我们研究的重点。我们表明，布里渊光散射是研究铁电铌酸锶钡薄膜结构特征的一种出色的无损方法。对薄膜结构中布里渊光散射光谱的特征进行分析，并将其与块状晶体的光谱进行比较，使我们能够高精度地确定所研究薄膜的厚度以及由声波共振散射所决定的结构特征。
