Wu Kaituo, Xiang Zixun, Lu Xinbo, Yan Yichao, Wu Chunyang, Wang Tao, Zhang Wanli
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 611731, China.
Micromachines (Basel). 2025 Jan 15;16(1):94. doi: 10.3390/mi16010094.
Current stress sensors for microsystems face integration challenges and complex signal decoding. This paper proposes a real-time uniaxially sensitive stress sensor. It is obtained by simple combinations of bar resistors using their sensitivity differences in different axes. With the aid of a Wheatstone bridge, the sensor can measure the uniaxial stress magnitude by simple calibration of the stress against the output voltage and detect the bidirectional stress magnitude and direction in a micro-zone by simple rotation. The theoretical sensitivity obtained from simulation is 0.087 mV/V·MPa when the X-bridge is stressed in the X-direction under 1 V of excitation, and the test sensitivity of the X-bridge prepared in this paper is 0.1 mV/V·MPa. The design is structurally and procedurally simple, exhibits better temperature stability, and reduces interface requirements, making it suitable for the health monitoring of multi-chip microsystem chips.
当前用于微系统的应力传感器面临集成挑战和复杂的信号解码问题。本文提出了一种实时单轴敏感应力传感器。它是通过利用条形电阻在不同轴向上的灵敏度差异进行简单组合而获得的。借助惠斯通电桥,该传感器可以通过将应力与输出电压进行简单校准来测量单轴应力大小,并通过简单旋转检测微区域内的双向应力大小和方向。在1V激励下,当X桥在X方向上受力时,模拟得到的理论灵敏度为0.087mV/V·MPa,本文制备的X桥的测试灵敏度为0.1mV/V·MPa。该设计在结构和程序上都很简单,具有更好的温度稳定性,并降低了接口要求,适用于多芯片微系统芯片的健康监测。