Han Yejin, Jeong Jihwan, Cho Hyein, Ahn Yebin, Park Soohyeok, Kim HyeonSeok, Shin Jae Yeong, Park Min-Joon, Kim Taehyo, Um Han-Don
Department of Chemical Engineering, Kangwon National University, Chuncheon, 24341, Republic of Korea.
School of Energy and Chemical Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44919, Republic of Korea.
Adv Mater. 2025 Jul;37(28):e2502840. doi: 10.1002/adma.202502840. Epub 2025 Apr 14.
Metal-assisted chemical etching (MaCE) has emerged as a promising technique for fabricating silicon nanostructures, yet the presence of anomalous isotropic etching poses significant challenges for precise dimensional control. Here, it is demonstrated that catalyst morphology, particularly its aspect ratio, plays a crucial role in determining etching directionality. Through systematic investigation of the initial stages of MaCE, it is revealed that significant undercutting occurs within seconds of etching initiation, persisting across all solution compositions. This phenomenon is quantitatively analyzed using the Degree of Undercutting (DoU) and Degree of Anisotropy (DoA) metrics, establishing that conventional solution chemistry control alone cannot suppress lateral etching. These findings reveal that high-aspect-ratio dendrite catalysts, formed at elevated AgNO concentrations, undergo physical separation during etching, leading to residual catalysts that promote localized isotropic etching. To address this, a thermal treatment approach is developed that effectively transforms these problematic structures into stable, low-aspect-ratio catalysts. A critical transition at 450 °C, where enhanced silver atom mobility coincides with surface defect formation, enables nearly perfect vertical etching. This work not only provides fundamental insights into the relationship between catalyst geometry and etching behavior but also presents a practical solution for achieving precise control over silicon nanostructure fabrication.
金属辅助化学蚀刻(MaCE)已成为一种用于制造硅纳米结构的有前景的技术,然而异常各向同性蚀刻的存在对精确的尺寸控制提出了重大挑战。在此,证明了催化剂形态,特别是其纵横比,在确定蚀刻方向性方面起着关键作用。通过对MaCE初始阶段的系统研究,发现蚀刻开始后几秒钟内就会出现显著的底切现象,并且在所有溶液成分中都会持续存在。使用底切度(DoU)和各向异性度(DoA)指标对这一现象进行了定量分析,确定仅靠传统的溶液化学控制无法抑制横向蚀刻。这些发现表明,在较高的AgNO浓度下形成的高纵横比树枝状催化剂在蚀刻过程中会发生物理分离,导致残留催化剂促进局部各向同性蚀刻。为了解决这个问题,开发了一种热处理方法,该方法有效地将这些有问题的结构转变为稳定的、低纵横比的催化剂。在450°C时发生了一个关键转变,此时银原子迁移率的提高与表面缺陷的形成相吻合,从而实现了近乎完美的垂直蚀刻。这项工作不仅提供了关于催化剂几何形状与蚀刻行为之间关系的基本见解,还提出了一种实现对硅纳米结构制造进行精确控制的实用解决方案。