Tyagi Viren, Pols Mike, Brocks Geert, Tao Shuxia
Materials Simulation & Modelling, Department of Applied Physics and Science Education, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands.
Center for Computational Energy Research, Department of Applied Physics and Science Education, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands.
J Phys Chem Lett. 2025 May 22;16(20):5153-5159. doi: 10.1021/acs.jpclett.5c01139. Epub 2025 May 15.
Halide perovskite optoelectronic devices suffer from chemical degradation and current-voltage hysteresis induced by migration of highly mobile charged defects. Atomic scale molecular dynamics simulations can capture the motion of these ionic defects, but classical force fields are too inflexible to describe their dynamical charge states. Using CsPbI as a case study, we train machine learned force fields from density functional theory calculations and study the diffusion of charged halide interstitial and vacancy defects in bulk CsPbI. We find that negative iodide interstitials and positive iodide vacancies, the most stable charge states for their respective defect type, migrate at similar rates at room temperature. Neutral interstitials are faster, but neutral vacancies are 1 order of magnitude slower. Oppositely charged interstitials and vacancies, as they can occur in device operation or reverse bias conditions, are significantly slower and can be considered relatively immobile.
卤化物钙钛矿光电器件会受到化学降解以及由高迁移率带电缺陷迁移引起的电流-电压滞后现象的影响。原子尺度的分子动力学模拟可以捕捉这些离子缺陷的运动,但经典力场过于僵化,无法描述它们的动态电荷状态。以CsPbI为例,我们从密度泛函理论计算中训练机器学习力场,并研究体相CsPbI中带电卤化物间隙缺陷和空位缺陷的扩散。我们发现,负碘间隙缺陷和正碘空位缺陷(分别是各自缺陷类型中最稳定的电荷状态)在室温下以相似的速率迁移。中性间隙缺陷迁移速度更快,但中性空位缺陷的迁移速度慢1个数量级。带相反电荷的间隙缺陷和空位缺陷,由于它们可能出现在器件运行或反向偏置条件下,迁移速度明显较慢,可以认为相对不移动。