Li Pei, Li Song, Udvarhelyi Péter, Huang Bing, Gali Adam
School of Integrated Circuit Science and Engineering, Tianjin University of Technology, Tianjin, 300384, China.
Beijing Computational Science Research Center, Beijing, 100193, China.
Adv Sci (Weinh). 2025 Aug;12(30):e03350. doi: 10.1002/advs.202503350. Epub 2025 May 28.
Point defects may introduce defect levels into the fundamental bandgap of the host semiconductors that alter the electrical properties of the material. As a consequence, the in-gap defect levels and states automatically lower the threshold energy of optical excitation associated with the optical gap of the host semiconductor. It is, therefore, a common assumption that solid-state defect emitters in semiconductors ultimately alter the conductivity of the host. This study demonstrate, on a particular defect in 4H silicon carbide, that an unrecognized class of point defects exists that are optically active but electrically inactive in the ground state.
点缺陷可能会在主体半导体的基本带隙中引入缺陷能级,从而改变材料的电学性质。因此,带隙中的缺陷能级和状态会自动降低与主体半导体光学带隙相关的光激发阈值能量。所以,通常认为半导体中的固态缺陷发射体最终会改变主体的电导率。本研究表明,在4H碳化硅中的一种特定缺陷上,存在一类未被认识到的点缺陷,它们在基态下具有光学活性但电活性不明显。