Mehta Amritpal, Basandrai Daisy, Kaur Harneet, Kaur Jaspal, Basandrai Ashwani Kumar, Basu Umer, Singh Sukhwinder, Alsakkaf Waleed A A, Ali Hayssam M
Department of Plant Pathology, CSK Himachal Pradesh Agricultural University, Palampur, 176062, India.
ICAR-National Institute of Biotic Stress Management, Baronda, Raipur, Chhattisgarh, 493225, India.
BMC Plant Biol. 2025 Jul 1;25(1):786. doi: 10.1186/s12870-025-06788-0.
Powdery mildew (PM), caused by Blumeria graminis f. sp. tritici, and yellow rust (YR), caused by Puccinia striiformis f. sp. tritici, constitute significant threats to wheat production, resulting in both qualitative and quantitative losses. Although fungicides can effectively manage these diseases, their application introduces environmental and health risks and foster the development of pathogen resistance. The development and implementation of wheat genotypes that exhibit resistance to PM and YR present a sustainable, cost-effective, and environmentally responsible alternative to chemical treatments.
In the present study, influence of environmental factors and genotype by-environment interaction (GEI) was evaluated on 142 wheat genotypes for PM and YR across four and three geographically diverse hotspot locations, respectively. The AMMI analysis of variance revealed that GEI and genotype (G) accounted for most of the variation observed for PM and YR. Twenty genotypes were moderately resistant to PM at seedling stage. Notably, ten genotypes demonstrated high resistance to PM, while 37 were identified as resistant to YR. Furthermore, 30 genotypes exhibited slow mildewing resistance to PM at the adult plant stage. The combined analysis utilizing AMMI and GGE biplots indicated that the genotypes Pollmer/CTY88.547, Syros, and Talent (Pm5 + ?) portrayed the highest level of combined resistance to both PM and YR across the evaluated locations. Additionally, the environments Kukumseri 2016 (E2 and En1) were the most effective for testing and selecting superior wheat genotypes for resistance to PM and YR, respectively.
Integrating the strength of AMMI and GGE approaches enhances the accuracy of wheat genotype selection in multi- environment trials. Methods used showed strong agreement in identifying wheat genotypes resistant to PM and YR when facing diverse environmental factors.
由小麦白粉菌引起的白粉病（PM）和由条形柄锈菌引起的条锈病（YR）对小麦生产构成重大威胁，导致质量和数量上的损失。尽管杀菌剂可以有效控制这些病害，但它们的使用会带来环境和健康风险，并促进病原体抗性的发展。培育和推广对白粉病和条锈病具有抗性的小麦基因型，是一种可持续、经济高效且对环境负责的化学防治替代方案。
在本研究中，分别在四个和三个地理上不同的热点地区，对142个小麦基因型进行了环境因素及基因型与环境互作（GEI）对白粉病和条锈病影响的评估。AMMI方差分析表明，GEI和基因型（G）占观察到的白粉病和条锈病变异的大部分。20个基因型在苗期对白粉病表现为中度抗性。值得注意的是，10个基因型对白粉病表现出高抗性，37个被鉴定为对条锈病具有抗性。此外，30个基因型在成株期对白粉病表现出慢白粉抗性。利用AMMI和GGE双标图的综合分析表明，在评估的地点中，基因型Pollmer/CTY88.547、Syros和Talent（Pm5 +？）对白粉病和条锈病表现出最高水平的综合抗性。此外，环境Kukumseri 2016（E2和En1）分别是测试和选择对白粉病和条锈病具有抗性的优良小麦基因型最有效的环境。
整合AMMI和GGE方法的优势可提高多环境试验中小麦基因型选择的准确性。在面对不同环境因素时，所使用的方法在鉴定对白粉病和条锈病具有抗性的小麦基因型方面表现出高度一致性。
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