Alexis Lasserre, Léo Simon, Julien Eck, Jérôme Rossignol, Céline Dupont, Didier Stuerga
Department Interfaces, Laboratoire Interdisciplinaire Carnot de Bourgogne, UMR CNRS 6303, UBFC, Dijon, France.
Materials, Environments and Contamination Control Section, ESTEC - European Space Research and Technology Centre, Noordwijk, Netherlands.
Sci Rep. 2025 Jul 11;15(1):25018. doi: 10.1038/s41598-025-09312-4.
Organic contamination is a major problem in the space industry, particularly for satellite optical devices. Although the standards governing this problem are extremely strict, there is no efficient method to measure the in situ, real-time deposition of organic contaminants. An original method based on thickness measurement is reported and tested in this paper. The use of microwave transduction allows to estimate the thickness of paraffin oil and silicone oil deposits from a few nanometers to several hundred nanometers in a low-pressure (mbar) environment. A linear response of the microwave sensor as a function of contaminant layer thickness is thus evidenced for both silicone and paraffin oils, paving the way for the integration of this method as an on-board contamination detection device.
有机污染是航天工业中的一个重大问题，特别是对于卫星光学设备而言。尽管针对这一问题的相关标准极为严格，但目前尚无有效的方法来测量有机污染物的原位实时沉积情况。本文报道并测试了一种基于厚度测量的原创方法。利用微波传感技术能够在低压（毫巴）环境下，估算出从几纳米到几百纳米厚的石蜡油和硅油沉积物的厚度。由此证明，微波传感器对硅油和石蜡油的响应均与污染物层厚度呈线性关系，这为将该方法集成到机载污染检测设备中铺平了道路。
