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通过蒙特卡洛模拟推进X射线量子成像

Advancing X-ray quantum imaging through Monte-Carlo simulations.

作者信息

Espoukeh Pakhshan, Biener Gabriel, Baxter James, Aquila Andrew, Schwander Peter

机构信息

University of Wisconsin - Milwaukee, 3135 N. Maryland Ave, Milwaukee, WI, 53211, USA.

SLAC National Accelerator Laboratory, Menlo Park, CA, 94025, USA.

出版信息

Sci Rep. 2025 Jul 14;15(1):25359. doi: 10.1038/s41598-025-10495-z.

Abstract

Imaging with X-rays poses fundamental limits due to radiation damage of the highly energetic photons. This becomes problematic for sensitive biological systems such as subcellular structures. Lowering the radiation dose, without sacrificing the signal-to-noise ratio, would be desirable for any kind of imaging modalities involving X-rays. To achieve this goal, quantum imaging with entangled X-ray photons constitutes a promising route. Production of biphotons have been demonstrated in the X-ray regime by the process of Spontaneous Parametric Down-Conversion (SPDC). However, compared to SPDC in the regime of visible light, the production rate for X-ray biphotons is extremely low. With the introduction of new high average brightness X-ray sources, such as 4th generation synchrotrons and high repetition rate Free-Electron X-ray Lasers (XFEL), quantum imaging may become practical. We introduce a ray tracing approach using Monte-Carlo sampling, specifically designed for quantum imaging with entangled X-ray photons generated by SPDC. By simulation, the superior image quality of quantum over classical imaging methods is demonstrated using realistic experimental conditions available at high repetition rate XFELs. With these simulations, we can efficiently assist the design of future experiments at beam lines, which can substantially accelerate the advancement of X-ray quantum imaging and reduce costs.

摘要

由于高能光子的辐射损伤,X射线成像存在基本限制。对于诸如亚细胞结构等敏感生物系统而言,这会成为问题。对于任何涉及X射线的成像方式来说,在不牺牲信噪比的情况下降低辐射剂量是很有必要的。为实现这一目标,利用纠缠X射线光子进行量子成像构成了一条有前景的途径。通过自发参量下转换(SPDC)过程,已在X射线波段证明了双光子的产生。然而,与可见光波段的SPDC相比,X射线双光子的产生率极低。随着新型高平均亮度X射线源的引入,如第四代同步加速器和高重复率自由电子X射线激光(XFEL),量子成像可能会变得切实可行。我们引入一种使用蒙特卡洛采样的光线追踪方法,该方法专门为利用SPDC产生的纠缠X射线光子进行量子成像而设计。通过模拟,在高重复率XFEL现有的实际实验条件下,证明了量子成像相对于传统成像方法具有卓越的图像质量。通过这些模拟,我们可以有效地辅助光束线未来实验的设计,这能够大幅加速X射线量子成像的进展并降低成本。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/5516/12260058/49b9c8714371/41598_2025_10495_Fig2_HTML.jpg

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