Lee Taekyeong, You Miyoung, Kim Seohan, Song Pungkeun
Department of Materials Science and Engineering, Pusan National University, Busan 46241, Republic of Korea.
The Institute of Materials Technology, Pusan National University, Busan 46241, Republic of Korea.
Micromachines (Basel). 2025 Jun 25;16(7):742. doi: 10.3390/mi16070742.
This study synthesized boron-doped diamond (BDD) thin films using hot-filament chemical vapor deposition at different carbon-to-hydrogen (C/H) ratios in the range of 0.3-0.9%. The C/H ratio influence, a key parameter controlling the balance between diamond growth and hydrogen-assisted etching, was systematically investigated while maintaining other deposition parameters constant. Microstructural and electrochemical analysis revealed that increasing the C/H ratio from 0.3% to 0.7% led to a reduction in sp2-bonded carbon and enhanced the crystallinity of the diamond films. The improved conductivity under these conditions can be attributed to effective substitutional boron doping. Notably, the film deposited at a C/H ratio of 0.7% exhibited the highest electrical conductivity and the widest electrochemical potential window (2.88 V), thereby indicating excellent electrochemical stability. By contrast, at a C/H ratio of 0.9%, the excessively supplied carbon degraded the film quality and electrical and electrochemical performance, which was owing to the increased formation of sp carbon. In addition, this led to an elevated background current and a narrowed potential window. These results reveal that precise control of the C/H ratio is critical for optimizing the BDD electrode performance. Therefore, a C/H ratio of 0.7% provides the most favorable conditions for applications in advanced oxidation processes.
本研究采用热丝化学气相沉积法,在0.3%-0.9%的不同碳氢(C/H)比范围内合成了硼掺杂金刚石(BDD)薄膜。在保持其他沉积参数不变的情况下,系统地研究了C/H比这一控制金刚石生长与氢辅助蚀刻平衡的关键参数的影响。微观结构和电化学分析表明,将C/H比从0.3%提高到0.7%会导致sp2键合碳减少,并提高金刚石薄膜的结晶度。在这些条件下导电性的提高可归因于有效的替代硼掺杂。值得注意的是,在C/H比为0.7%时沉积的薄膜表现出最高的电导率和最宽的电化学电位窗口(2.88 V),从而表明其具有优异的电化学稳定性。相比之下,在C/H比为0.9%时,过量供应的碳会降低薄膜质量以及电学和电化学性能,这是由于sp碳的形成增加所致。此外,这导致背景电流升高和电位窗口变窄。这些结果表明,精确控制C/H比对优化BDD电极性能至关重要。因此,0.7%的C/H比为高级氧化过程中的应用提供了最有利的条件。