Drew H R, Dickerson R E
EMBO J. 1982;1(6):663-7. doi: 10.1002/j.1460-2075.1982.tb01227.x.
DNA polymers containing exclusively A.T or I.C base pairs frequently exhibit D- or E-type X-ray diffraction patterns when dried. The distribution of intensities in fiber patterns appears to demand helical structures with 7 and 7.5 bp/turn, respectively, but it is not stereochemically possible to wind a right-handed antiparallel B-family helix this tightly. It is a simple matter, however, to build a left-handed helix with 7-7.5 bp/turn by incorporating Hoogsteen pairing into a Z helix framework. X-ray intensities calculated from this novel left-handed Hoogsteen model provide as reasonable a fit to the D-DNA diffraction pattern as do intensities calculated from previously proposed right-handed 8-fold models.
仅含有A.T或I.C碱基对的DNA聚合物在干燥时经常呈现D型或E型X射线衍射图案。纤维图案中的强度分布似乎分别需要每圈7和7.5个碱基对的螺旋结构,但从立体化学角度来看,将右手反平行B族螺旋缠绕得如此紧密是不可能的。然而,通过将Hoogsteen配对纳入Z螺旋框架中,构建一个每圈7 - 7.5个碱基对的左手螺旋是一件简单的事情。从这个新颖的左手Hoogsteen模型计算出的X射线强度与从先前提出的右手8重模型计算出的强度一样,能合理地拟合D - DNA衍射图案。