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在估计自发突变率时考虑平板接种效率。

Accounting for plating efficiency when estimating spontaneous mutation rates.

作者信息

Jones M E

机构信息

School of Medicine, Flinders University of South Australia, Adelaide.

出版信息

Mutat Res. 1993 Oct;292(2):187-9. doi: 10.1016/0165-1161(93)90146-q.

Abstract

When the spontaneous mutation rate mu in mammalian cell cultures is estimated using Luria-Delbrück fluctuation analysis, many factors contribute to the unreliability of the estimate. Some of these have been documented by Featherstone et al. (1987) and by Kendal and Frost (1988). In particular, the plating efficiencies for mammalian cells are often much less than 100%, and this can be taken into account. A derivation of a generalized P0 estimator, mg, based on the classical P0 estimator of Luria and Delbrück (1943) is offered. In an experiment involving C cultures, of which z exhibit no mutant colonies, and in which the plating efficiency is p, (0 < p < 1), the estimated mean number of mutations per culture is given by [formula: see text] The classical P0 estimator is shown to be the limiting case of mg as plating efficiency tends to 100%.

摘要

当使用卢里亚-德尔布吕克波动分析来估计哺乳动物细胞培养中的自发突变率μ时,许多因素会导致估计结果不可靠。费瑟斯通等人(1987年)以及肯德尔和弗罗斯特(1988年)已经记录了其中一些因素。特别是,哺乳动物细胞的接种效率通常远低于100%,这一点可以考虑在内。本文基于卢里亚和德尔布吕克(1943年)的经典P0估计器,推导了广义P0估计器mg。在一个涉及C个培养物的实验中,其中z个没有出现突变菌落,且接种效率为p(0 < p < 1),每个培养物的估计平均突变数由[公式:见正文]给出。经典P0估计器被证明是接种效率趋于100%时mg的极限情况。

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