Predictive validity of the Level of Expressed Emotion (LEE) Scale: readmission follow-up data for 1, 2, and 5-year periods.

The predictive validity of the Level of Expressed Emotion (LEE) Scale in a group of schizophrenic patients was examined. Forty-six patients with DSM-III diagnoses of schizophrenic disorders were administered the perceived expressed emotion measure (LEE) and followed up for a 5-year period. Patients' ratings of their social environments were related to rehospitalization 1 year, 2 years (p < .02) and 5 years (p < .01) after initial assessment. These results supported the utility of the LEE in identifying schizophrenic patients at high risk for rehospitalization.