Liu Q, Huang Z, Cui L
Xin Hua Hospital, Shanghai Second Medical University.
Zhonghua Fu Chan Ke Za Zhi. 1995 Sep;30(9):518-21.
To make certain of the duration of using V-copper 200mm2 intrauterine device (VCu200 IUD).
Six hundreds and sixty six pieces of VCu200 IUD used for different time period and removed for various reasons were analyzed. The life span of VCu200 IUD depended on corrosion, fragmentation and damage of copper wire and these parameters were measured on VCu200 IUD removed.
There were significant difference in copper wire fragmentation rate between tenth year-group and fifteenth year group which were 12.36%, 25.53% respectively (P < 0.001), and so were the expulsion rate of copper wire 2.54%, 9.57% respectively (P < 0.05). The copper loss and copper releasing rate in tenth year-group were 39.73%, 22.95%micrograms/day respectively. Copper corrosion resulted in fragmentation of copper wire which occurred the earliest in three years of use and expulsion of copper wire segment occurred after five years of use.
Comparing the above results with other copper intrauterine devices, it was suggested that the suitable duration of VCu200 IUD use was ten years.