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一种通过场发射扫描电子显微镜观察重金属染色和包埋生物组织的新方法。

A novel method for viewing heavy metal stained and embedded biological tissue by field emission scanning electron microscopy.

作者信息

Richards R G, ap Gwynn I

机构信息

AO/ASIF Research Institute, Davos, Switzerland.

出版信息

Scanning Microsc. 1996;10(1):111-8; discussion 118-9.

PMID:9813601
Abstract

Backscattered electron (BSE) imaging was used to display heavy metal stained biological structures of various embedded specimens. Samples were fixed, stained and embedded in resin blocks as with preparation for the transmission electron microscope (TEM). Blocks were trimmed to center the specimens in a trapezoidal face of up to 5 mm2 and their sides painted with conductive silver paint leaving the face uncovered. Blocks were sputter coated with 6-8 nm of silver, chromium or aluminum, with aluminum providing the best specimen contrast in BSE mode. Samples were examined in a field emission scanning electron microscope operated at a high emission current of 50 microA. Both the fixation protocol and microscope operating parameters were optimized to maximize the number of BSE available from the smallest probe. An accelerating voltage of 10 keV was found optimal for resolution and contrast. The technique allowed the direct visualization of embedded samples at resolutions beyond light microscopy with good contrast, without cutting sections, and avoiding grid bars obscuring areas of interest. The two dimensional images provided averaged information on the internal structures of the specimens in relation to the predicted emission depth of the BSE. The technique could be used for rapid diagnostics in pathological examinations, or for routine preselection of areas of interest within a sample face before final trimming for ultrathin sectioning for higher resolution TEM study.

摘要

背散射电子(BSE)成像用于显示各种包埋标本中重金属染色的生物结构。样品的固定、染色和包埋于树脂块的过程与透射电子显微镜(TEM)的样品制备相同。将树脂块修整,使标本位于面积最大为5 mm2的梯形面上的中心位置,并在其侧面涂上导电银漆,而标本面不覆盖。对树脂块进行溅射镀膜,镀上6 - 8 nm厚的银、铬或铝,其中铝在BSE模式下能提供最佳的标本对比度。在一台场发射扫描电子显微镜中对样品进行检测,该显微镜在50微安的高发射电流下运行。固定方案和显微镜操作参数均经过优化,以从最小的探针获得最大数量的背散射电子。发现10 keV的加速电压对于分辨率和对比度最为理想。该技术能够在不切片且避免栅格条遮挡感兴趣区域的情况下,以优于光学显微镜的分辨率直接观察包埋样品,且对比度良好。二维图像提供了关于标本内部结构的平均信息,这些信息与背散射电子的预测发射深度相关。该技术可用于病理检查中的快速诊断,或在对样品面进行最终修整以制备超薄切片用于更高分辨率的TEM研究之前进行感兴趣区域的常规预选。

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