Liu Yang, Li Xu, Kim Young L, Backman Vadim
Department of Biomedical Engineering, Northwestern University, Evanston, Illinois 60208, USA.
Opt Lett. 2005 Sep 15;30(18):2445-7. doi: 10.1364/ol.30.002445.
The spectral properties of elastic light-scattering signals have been shown to provide a wealth of information on nanostructures and microstructures. We present elastic backscattering spectroscopic microscopy that allows simultaneous acquisition of microscopic images and backscattering spectra at each pixel. Within a single homogeneous micrometer-scale particle we observe two distinct and highly localized spectral oscillation features that arise from different optical paths: (1) surface waves (e.g., the ripple structure) and (2) a not previously reported anomalous ripple structure that is due to the interference of waves scattered from front and back surfaces at the particle's center. We also demonstrate that the spectroscopic data can provide nanoscale structural information beyond what conventional microscopy reveals.
弹性光散射信号的光谱特性已被证明能提供有关纳米结构和微观结构的丰富信息。我们展示了弹性背散射光谱显微镜，它能够在每个像素处同时采集微观图像和背散射光谱。在单个均匀的微米级粒子中，我们观察到由不同光路产生的两种不同且高度局域化的光谱振荡特征：（1）表面波（例如，波纹结构）和（2）一种先前未报道的异常波纹结构，它是由于粒子中心前后表面散射的波的干涉所致。我们还证明，光谱数据能够提供超出传统显微镜所揭示的纳米级结构信息。
