Garcia R, Gómez C J, Martinez N F, Patil S, Dietz C, Magerle R
Instituto de Microelectrónica de Madrid, CSIC, Isaac Newton 8, 28760 Tres Cantos, Madrid, Spain.
Phys Rev Lett. 2006 Jul 7;97(1):016103. doi: 10.1103/PhysRevLett.97.016103.
Identification of energy-dissipation processes at the nanoscale is demonstrated by using amplitude-modulation atomic force microscopy. The variation of the energy dissipated on a surface by a vibrating tip as a function of its oscillation amplitude has a shape that singles out the dissipative process occurring at the surface. The method is illustrated by calculating the energy-dissipation curves for surface energy hysteresis, long-range interfacial interactions and viscoelasticity. The method remains valid with independency of the amount of dissipated energy per cycle, from 0.1 to 50 eV. The agreement obtained between theory and experiments performed on silicon and polystyrene validates the method.
通过使用振幅调制原子力显微镜证明了纳米尺度能量耗散过程的识别。振动探针在表面上耗散的能量随其振荡幅度的变化具有一种形状，这种形状能区分出表面发生的耗散过程。通过计算表面能滞后、长程界面相互作用和粘弹性的能量耗散曲线来说明该方法。该方法在每个周期耗散能量从0.1到50电子伏特的情况下，与耗散能量的量无关，仍然有效。在硅和聚苯乙烯上进行的理论与实验之间取得的一致性验证了该方法。
