Science. 1987 Sep 18;237(4821):1439-44. doi: 10.1126/science.237.4821.1439.
The new technique of x-ray microtomography nondestructively generates three-dimensional maps of the x-ray attenuation coefficient inside small samples with approximately 1 percent accuracy and with resolution approaching 1 micrometer. Spatially resolved elemental maps can be produced with synchrotron x-ray sources by scanning samples at energies just above and below characteristic atomic absorption edges. The system consists of a high-resolution imaging x-ray detector and high-speed algorithms for tomographic image reconstruction. The design and operation of the microtomography device are described, and tomographic images that illustrate its performance with both synchrotron and laboratory x-ray sources are presented.
X 射线微断层扫描新技术可在无损条件下生成小样本内 X 射线衰减系数的三维图谱,准确度约为 1%,分辨率接近 1 微米。利用同步加速器 X 射线源,通过在特征原子吸收边缘上下的能量对样品进行扫描,可生成具有空间分辨率的元素图谱。该系统包括高分辨率成像 X 射线探测器和用于断层图像重建的高速算法。本文介绍了微断层扫描设备的设计和操作,并展示了使用同步加速器和实验室 X 射线源的断层图像,说明了其性能。