Jellison G E, Modine F A
Appl Opt. 1997 Nov 1;36(31):8190-8. doi: 10.1364/ao.36.008190.
A new ellipsometer is described that uses two photoelastic modulator-polarizer pairs, where the photoelastic modulators are operating at differing resonant frequencies. The time-dependent intensity of the light beam is extremely complicated but can be analyzed so that all elements of the sample Mueller matrix are obtained. For a given configuration, nine of the Mueller matrix elements can be measured at any one time; the other seven elements are accessible when the azimuthal angles of the photoelastic modulators are changed. The single-configuration measurement is often sufficient to characterize a number of real situations completely, such as film growth in a vacuum environment, anisotropic samples, and simple depolarization.
