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Preparation of TEM samples of ferritic alloys.

作者信息

Yao Z, Xu S, Jenkins M L, Kirk M A

机构信息

Department of Materials, University of Oxford, Parks Rd., Oxford OX1 3PH, UK.

出版信息

J Electron Microsc (Tokyo). 2008 Jun;57(3):91-4. doi: 10.1093/jmicro/dfn004. Epub 2008 Mar 3.

DOI:10.1093/jmicro/dfn004
PMID:18316797
Abstract

We describe techniques for electropolishing irradiated ferritic specimens for examination under the TEM in situations where the foil quality is of utmost importance. First, we describe some modifications to the standard technique for making plan-view specimens aimed at optimizing the foil quality. Second, we describe a technique for making plan-view specimens from a region of buried damage in a specimen irradiated with 2 MeV Fe(+) ions.

摘要

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