Matsui Hiroyuki, Hasegawa Tatsuo, Tokura Yoshinori, Hiraoka Maki, Yamada Toshikazu
Correlated Electron Research Center , AIST, Tsukuba 305-8562, Japan.
Phys Rev Lett. 2008 Mar 28;100(12):126601. doi: 10.1103/PhysRevLett.100.126601. Epub 2008 Mar 27.
Polaron states in organic thin-film transistors (TFTs) were investigated by the electron spin resonance (ESR) technique. Gate-field-dependent and temperature-dependent single-Lorentzian ESR spectra were observed for field-induced polarons in pentacene TFTs, demonstrating the effect of motional narrowing due to polaron diffusion. Analyses of the ESR linewidth revealed a considerably long trapping time (tau_(C) approximately 0.7 ns), the variation of which is discussed in terms of the multiple trap-and-release model.
通过电子自旋共振（ESR）技术研究了有机薄膜晶体管（TFT）中的极化子态。在并五苯TFT中，观察到了场诱导极化子的与栅极场相关和与温度相关的单洛伦兹ESR谱，证明了极化子扩散导致的运动窄化效应。对ESR线宽的分析揭示了相当长的俘获时间（τC约为0.7纳秒），并根据多陷阱-释放模型讨论了其变化情况。
