Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
Ultramicroscopy. 2010 Mar;110(4):325-9. doi: 10.1016/j.ultramic.2010.01.004. Epub 2010 Jan 21.
A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics.
描述了一种定量描述任意光学系统复值焦场的技术，并将其应用于重建反射/衍射硬 X 射线镜产生的相干聚焦光束。这种基于相衬术的相位恢复方法是 X 射线光学特性表征的重要进展，因为获得的信息和潜在的分辨率远远超过直接探测焦点的方法。因此，相衬术非常适合于未来的纳米聚焦 X 射线光学元件的特性描述和对准。
