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外延石墨烯中载流子动力学的超快瞬态吸收显微镜研究。

Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene.

机构信息

Notre Dame Radiation Laboratory, University of Notre Dame, Notre Dame, Indiana 46556-5670, USA.

出版信息

Nano Lett. 2010 Apr 14;10(4):1308-13. doi: 10.1021/nl904106t.

Abstract

Transient absorption microscopy was employed to image charge carrier dynamics in epitaxial multilayer graphene. The carrier cooling exhibited a biexponential decay that showed a significant dependence on carrier density. The fast and slow relaxation times were assigned to coupling between electrons and optical phonon modes and the hot phonon effect, respectively. The limiting value of the slow relaxation time at high pump intensity reflects the lifetime of the optical phonons. Significant spatial heterogeneity in the dynamics was observed due to differences in coupling between graphene layers and the substrate.

摘要

瞬态吸收显微镜被用来成像外延多层石墨烯中的载流子动力学。载流子冷却呈现双指数衰减,这表明其对载流子密度有显著的依赖性。快和慢弛豫时间分别被分配给电子和光声子模式之间的耦合以及热声子效应。在高泵浦强度下,慢弛豫时间的极限值反映了光声子的寿命。由于石墨烯层与衬底之间的耦合不同,观察到动力学的显著空间非均质性。

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