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在碳化硅衬底上生长的外延石墨烯中的多维表征、朗道能级和态密度

Multidimensional characterization, Landau levels and Density of States in epitaxial graphene grown on SiC substrates.

作者信息

Camara Nicolas, Jouault Benoit, Jabakhanji Bilal, Caboni Alessandra, Tiberj Antoine, Consejo Christophe, Godignon Philipe, Camassel Jean

机构信息

Laboratoire Charles Coulomb, UMR 5221 CNRS-UM2, Place Eugène Bataillon, 34095 Montpellier Cedex 5, France.

出版信息

Nanoscale Res Lett. 2011 Feb 14;6(1):141. doi: 10.1186/1556-276X-6-141.

Abstract

Using high-temperature annealing conditions with a graphite cap covering the C-face of, both, on axis and 8° off-axis 4H-SiC samples, large and homogeneous single epitaxial graphene layers have been grown. Raman spectroscopy shows evidence of the almost free-standing character of these monolayer graphene sheets, which was confirmed by magneto-transport measurements. On the best samples, we find a moderate p-type doping, a high-carrier mobility and resolve the half-integer quantum Hall effect typical of high-quality graphene samples. A rough estimation of the density of states is given from temperature measurements.

摘要

通过在高温退火条件下,使用石墨帽覆盖轴向和8°离轴4H-SiC样品的C面,生长出了大面积且均匀的单外延石墨烯层。拉曼光谱显示了这些单层石墨烯片几乎独立的特性,这一特性通过磁输运测量得到了证实。在最佳样品上,我们发现了适度的p型掺杂、高载流子迁移率,并观测到了高质量石墨烯样品典型的半整数量子霍尔效应。通过温度测量给出了态密度的粗略估计。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2654/3211189/f34fe4116ffb/1556-276X-6-141-1.jpg

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